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2 of 3 people found the following review helpful:
5.0 out of 5 stars Spectroscopic Ellipsometry and Reflectometry - A Users Guide, November 16, 2000
By 
James B. Wilhelm Jr (Round Rock, Texas USA) - See all my reviews
This review is from: Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Hardcover)
Most useful book on this subject I have ever read.
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5.0 out of 5 stars Book on SE, January 18, 2008
By 
Ester van Gerwen (Veldhoven, Noord-Brabant Netherlands) - See all my reviews
This review is from: Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Hardcover)
A good follow up on Tompkins "A user's guide to Ellipsometry". This book deals with Spectroscopic Ellipsometry, but also covers the basics of single-wavelength ellipsometry. The book covers analysis of Thermal Oxide, PECVD SiO, SiO2, SiN, a-Si, etc. It also covers the mathematics behind the Lorentz oscillator, used in SE layer modelling.
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Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Spectroscopic Ellipsometry and Reflectometry: A User's Guide by Harland G. Tompkins (Hardcover - March 4, 1999)
$148.00 $123.31
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