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Statistical Methods for Industrial Process Control (Solid State Science and Engineering Series)
 
 
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Statistical Methods for Industrial Process Control (Solid State Science and Engineering Series) [Hardcover]

David Drain (Author)

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Book Description

0412085119 978-0412085116 February 1, 1997 1st
To practice engineering effectively, engineers must need to have a working knowledge of statistical concepts and methods. What they do not need is a background heavy on statistical theory and number crunching.
Statistical Methods for Industrial Process Control provides the practical statistics foundation engineers can immediately apply to the work they do every day, regardless of their industry or specialty. The author illustrates statistical concepts and methods with authentic semiconductor manufacturing process examples-integrated circuit fabrication is an exceedingly rich medium for communicating statistical concepts. However, once learned, these concepts and methods can easily be extended and applied to a variety of other industries.
The text emphasizes the application of statistical tools, rather than statistical theory. Modern advances in statistical software have made tedious computations and formula memorization unnecessary. Therefore, the author demonstrates software use throughout the book and supplies MINITAB examples and SAS programs. Review problems at the end of each chapter challenge and deepen readers' understanding of the material.
Statistical Methods for Industrial Process Control addresses topics that support the work engineers do, rather than educate them as statisticians, and these topics also reflect modern usage. It effectively introduces novice engineers to a fascinating industry and enables experienced engineers to build upon their existing knowledge and learn new skills.

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Inside This Book (learn more)
First Sentence:
Chapter 1 provides an introduction to the most basic principles underlying the use of statistics and enables the reader to apply some of these principles to real problems. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
total measurement standard deviation, beta risk curve, upper accept limit, poly doping process, scratched wafers, maximum allowable bias, nested within lots, nested variance components, gate oxide process, key product characteristics, upper level component, alpha risk, wafer component, defective wafers, measurements nested, overlay registration, predictor settings, successive points fall, key process parameters, limit intersects, total measurement error, particular wafer, population normality, pure error lack, variation from target
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Lower Upper, Time Fig, Squares Square, Value Prob, Adj R-sq, Dep Mean, Sum of Mean Source, Estimate Error Parameter, Measurement Standard Deviation Bias, True Value Fig, Wafer Operator, Average Count, Chart Beta, Los Angeles
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