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Statistical Methods for Testing, Development, and Manufacturing
 
 
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Statistical Methods for Testing, Development, and Manufacturing [Hardcover]

Forrest W. Breyfogle III (Author)

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Book Description

March 1992 0471540358 978-0471540359 1
Clearly illustrates how established techniques can be easily understood and used with a sample size that is smaller than normally envisioned. Provides solutions to complex industrial problems by demonstrating how to define the problem and evaluate it statistically with the aim of accelerating product design testing that requires fewer samples and offers more information with less test effort. Along with examples, it contains detailed additional material presented in tabular form for both easy reference and cross-reference.

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Clearly illustrates how established techniques can be easily understood and used with a sample size that is smaller than normally envisioned. Provides solutions to complex industrial problems by demonstrating how to define the problem and evaluate it statistically with the aim of accelerating product design testing that requires fewer samples and offers more information with less test effort. Along with examples, it contains detailed additional material presented in tabular form for both easy reference and cross-reference.

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The financial crisis of the day highlights the need for a 21st century management governance system that cannot be "gamed." The Integrated Enterprise Excellence (IEE) business system provides such a system, where scorecards, strategic planning, and process improvement are integrated so that organizations move toward achieving the 3 Rs of business; i.e., everyone doing the Right things, and doing them Right, at the Right time.

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Inside This Book (learn more)
First Sentence:
This text can help people solve a wide range of problems. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
failure rate criterion, contrast column numbers, sup volt, mot adj, tabular value corresponds, nonrepairable device, factorial design alternatives, fractional factorial experiment design, sample failure rate, fractional factorial techniques, basic test strategy, changing failure rate, experiment design considerations, factorial testing, probability plotting techniques, mot temp, permissible failures, total test time, half normal probability plot, simplex lattice designs, factorial experiment designs, factorial designed experiment, contrast columns, system failure rate, confidence interval statements
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Number of Trial, Copyright of Motorola, Department of Defense, Min Max, New York, Experiment Response, Biometrics Trustees, Edwards Deming, Lower Upper, None Curved, Target Shields, The Motorola, Van Nostrand Reinhold
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