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failure rate criterion, contrast column numbers, sup volt, mot adj, tabular value corresponds, nonrepairable device, factorial design alternatives, fractional factorial experiment design, sample failure rate, fractional factorial techniques, basic test strategy, changing failure rate, experiment design considerations, factorial testing, probability plotting techniques, mot temp, permissible failures, total test time, half normal probability plot, simplex lattice designs, factorial experiment designs, factorial designed experiment, contrast columns, system failure rate, confidence interval statements
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Number of Trial, Copyright of Motorola, Department of Defense, Min Max, New York, Experiment Response, Biometrics Trustees, Edwards Deming, Lower Upper, None Curved, Target Shields, The Motorola, Van Nostrand Reinhold
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