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Statistical Process Control [Hardcover]

Leonard A Doty (Author)
5.0 out of 5 stars  See all reviews (1 customer review)


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Hardcover $34.95  
Hardcover, January 1, 1996 --  

Book Description

January 1, 1996
  • Provides a description and history of SPC along with an analysis of how it is applied to control quality costs, productivity, product improvement, and work efficiency.
  • Includes a new chapter on the "Tools of Quality" that provides a complete explanation of the seven basic tools.
  • Presents an improved discussion on the nature of control charts and a complete rewrite of most of the text to better facilitate an understanding of current trends in quality management.
  • Covers unusual but important topics such as, humanistic concepts, DOE (design of experiments), and the probability rules and distributions needed for acceptance sampling.
  • Takes special care throughout to fully explain how to read and interpret the various control charts used in the implementation of SPC.


Product Details

  • Hardcover: 400 pages
  • Publisher: Industrial Press, Inc.; 2nd edition (January 1, 1996)
  • Language: English
  • ISBN-10: 0831130695
  • ISBN-13: 978-0831130695
  • Product Dimensions: 9.4 x 6 x 0.9 inches
  • Shipping Weight: 1.6 pounds
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #1,843,138 in Books (See Top 100 in Books)

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4 of 6 people found the following review helpful:
5.0 out of 5 stars excellent book, April 5, 2000
By A Customer
This review is from: Statistical Process Control (Hardcover)
This is one of the book any engineer working in semiconductor should own. Even though it is not very specific about examples which can be used directly but it gives nice overview of SPC. It talks about fundamentals which is more important to learn. It gives some examples which any one can use as a comparision. The problems given at the end of chapters are really interesting and are helpful in understanding subject more.
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Inside This Book (learn more)
First Sentence:
Statistical process control (SPC) is mostly technical in nature-it is actually just the technical arm of the author's SPC/TQM quality management system. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
specialized control charts, first subgroup average, weighted charts, chart using attributes data, grouped data formula, optimum mean value, revised control chart, trial control limits, constant subgroup size, nonmanufacturing applications, nonmanufacturing situations, normal curve analysis, variable subgroup size, specification midpoint, central trend line, chart midpoint, average subgroup size, larger subgroup sizes, nonmanufacturing processes, first sampling plan, normal curve approximation, attributes control charts, basic control charts, control chart patterns, revised limits
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Gages Date, Spec Operator, Process Chart, Edwards Deming, Sample Number Figure, United States, Answers X-bar, Process Gages, Spec Inspector, Malcolm Baldrige, World War, Maximum Desired Percent of Items Above, Answer Problem, Factor Low High Time, Incoming Quality, Sample X-bar
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