Supplement to IEEE Std 1491.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture [Paperback]

IEEE (Author)

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Product Details

Paperback: 66 pages
Publisher: Inst of Elect & Electronic (March 1995)
Language: English
ISBN-10: 1559374977
ISBN-13: 978-1559374972
Product Dimensions: 10.8 x 8.2 x 0.2 inches
Shipping Weight: 1.6 ounces
Amazon Best Sellers Rank: #10,568,957 in Books (See Top 100 in Books)

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