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1 of 1 people found the following review helpful:
5.0 out of 5 stars
Must have for professionals, teachers and students,
This review is from: System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon) (Hardcover)
This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by L.T. Wang.
You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teaching students at the University. For teaching you are granted access to training material and ATPG software to use with students for free. |
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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon) by Nur A. Touba (Hardcover - December 4, 2007)
$75.95 $68.53
In Stock | ||