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System-level Test and Validation of Hardware/Software Systems (Springer Series in Advanced Microelectronics)
 
 
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System-level Test and Validation of Hardware/Software Systems (Springer Series in Advanced Microelectronics) [Hardcover]

Matteo Sonza Reorda (Editor), Zebo Peng (Editor), Massimo Violante (Editor)

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Book Description

April 7, 2005 Springer Series in Advanced Microelectronics (Book 17)
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.

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From the Back Cover

New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. As well as giving rise to new design practices, SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the necessary infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction such as higher functional performance and greater operating speed. Research efforts are already addressing this issue. System-level Test and Validation of Hardware/Software Systems provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: • modeling of bugs and defects; • stimulus generation for validation and test purposes (including timing errors; • design for testability. For researchers working on system-level validation and testing, for tool vendors involved in developing hardware-software co-design tools and for graduate students working in embedded systems and SOC design and implementation, System-level Test and Validation of Hardware/Software Systems will be an invaluable source of reference.

About the Author

Matteo Sonza Reorda is the leader of the computer-aided design group of the Dipartimento di Automatica e Informatica, Politecnico di Torino. Zebo Peng is Professor of the chair in Computer Systems and Director of the Embedded Systems Laboratory at Linköping University.

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
pseudorandom test sequence, deterministic test sequence, deterministic test set, achievable fault coverage, test pattern broadcasting, hybrid test set, total test length, unreliability values, microprocessor descriptions, processor customization, abnormal system behavior, deterministic test patterns, pseudorandom test patterns, simulatable models, warm spares, fault coverage figures, functional test generation, toggle coverage, implicit functionality, given test pattern, pseudorandom vectors, system unreliability, error span, spare memories, test length time
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Conference, Sonza Reorda, Design Automation Conference, Test Symposium, Journal of Electronic Testing, Kluwer Academic Publishers, Test of Computers, Hardware Design Language, International Symposium
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