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1 of 1 people found the following review helpful:
5.0 out of 5 stars
Great book for thin film XRD,
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This review is from: Thin Film Analysis by X-Ray Scattering (Hardcover)
Because of the time limitation, I only read Chapter 6 for residual stress analysis, it was hard to follow at the beginning. After reading other reference papers and having better understanding about the theory, I read it again, I found the whole chapter was so well organized and I extremely like "complexity of ladder" structure, it is a real smart way to describe a complex scientific problem layer by layer. I enjoyed this book a lot and plan to read through all of it.
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Thin Film Analysis by X-Ray Scattering by Mario Birkholz (Hardcover - February 7, 2006)
$195.00 $162.14
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