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Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics (Springer Tracts in Modern Physics)
 
 
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Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics (Springer Tracts in Modern Physics) [Hardcover]

Henning Friis Poulsen (Author)

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Book Description

3540223304 978-3540223306 October 15, 2004 1

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.


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Editorial Reviews

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From the reviews:

"The aim of this book is to give a comprehensive account of 3DXRD microscopy, with a focus both on methodology and on applications. … the book may serve to stimulate research in other fields also, such as geophysics, geology, chemistry, and pharmaceutical science. In short, the book is a very sound and gainful enterprise with good focus … which is a welcome feature. Scientists working in the field will have cause to be elated at the prospect of acquiring and referring to the volume." (Current Engineering Practice, Vol. 47 (3), 2004-2005)


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Inside This Book (learn more)
First Sentence:
Hard polycrystalline materials such as metals, alloys and ceramics form the basis of much of modern industry. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
distinct diffraction spots, conical slit, contrast tomography, grain maps, cube grains, deformed microstructure, orientation spread, spot overlap, discrete tomography, position orientation space, secondary spots, box beans, gauge volume, mosaic spread, dislocation structures, neighboring grains, tensile axis, orientation mapping, oscillation range, lattice strain, penetration power, external strain
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Acta Mater, New York, Juul Jensen, Synchrotron Radiat, Acta Crystallogr, Oxford University Press, Riso National Laboratory, International Union of Crystallography, Related Analysis, Academic Press, Acta Metall, Analysis of Single Grains, Materials Research Society
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