Transmission Electron Microscopy and Diffractometry of Materials [Hardcover]

Brent Fultz (Author), James M. Howe (Author)

Book Description

Publication Date: November 1, 2009 | ISBN-10: 3540738851 | ISBN-13: 978-3540738855 | Edition: 3rd

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Editorial Reviews

Review

"I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."
(John Hutchison in Journal of Microscopy)
"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."
(Ray Egerton in Micron)
"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."
(John C. H. Spence, Arizona State University)
"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."
(Colin Humphries, Cambridge University)
"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."
(Ronald Gronsky, University of California, Berkeley)

From the reviews of the second edition:

"Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 … but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions ‘ranging from substantial re-structuring to subtle rewording’. … I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories … ." (Ultramicroscopy, Vol. 99, 2004)

"The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. … Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive … . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003)

"The main objective of the present book is teaching. … Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended … ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003)

--This text refers to an alternate Hardcover edition.

From the Back Cover

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’ Ronald Gronsky, University of California, Berkeley

Product Details

• Hardcover: 778 pages
• Publisher: Springer; 3rd edition (November 1, 2009)
• Language: English
• ISBN-10: 3540738851
• ISBN-13: 978-3540738855
• Product Dimensions: 9.4 x 6.1 x 1.3 inches
• Shipping Weight: 2.6 pounds (View shipping rates and policies)
• Average Customer Review: 3.5 out of 5 stars  See all reviews (4 customer reviews)
• Amazon Best Sellers Rank: #553,163 in Books (See Top 100 in Books)
  • #47 in Books > Professional & Technical > Professional Science > Chemistry > Crystallography
  • #63 in Books > Professional & Technical > Professional Science > Physics > Nanostructures
  • #91 in Books > Professional & Technical > Professional Science > Physics > Applied

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Customer Reviews

Most Helpful Customer Reviews

3.0 out of 5 stars There are better books out there, September 1, 2010

By 

R. M. "Nerd Alert" (Boston, MA) - See all my reviews

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This review is from: Transmission Electron Microscopy and Diffractometry of Materials (Hardcover)

I bought this book for a TEM/Diffraction class. A friend summed it up nicely: all the information you could want about TEM is in this book, but boy, do you have to dig for it.

Often rambling; hard to get the important concepts due to the large amount of verbose text. Problems in back of chapters often hard to solve unless you are making just the right assumptions. This is too bad, since Fultz's work is often interesting and his conversational style could be nice if it was reigned in a bit.

Get Willams and Carter for all practical purposes. The book from Goodhew, Humphreys, and Beanland is less mathematically rigorous than Fultz's but much more effective at getting concepts across. Egerton's book seems to be common, but I find it to be a bit too brief for me. There are a zillion TEM/Diffraction books out there, spend an afternoon in the library and choose one that suits your learning style.

1.0 out of 5 stars Redudant and unclear, April 18, 2010

By 

J.H. - See all my reviews

This review is from: Transmission Electron Microscopy and Diffractometry of Materials (Hardcover)

I cannot agree with the previous comments at all. Among all the books I've read in the area of materials characterization, this book is one of, if not, the most tedious one. Some concepts should have been explained in a much more concise and clear way. The description is very redundant and intimidating. The author fails to include more experimental contents but tells you where the sum of a geometric series comes from. Among many concepts and terms, the author smugly add much useless description which brings you nothing but headache. Other books, such as the famous TEM textbook by Williams and Carter, is obviously much much better than this one.

5.0 out of 5 stars Excellent TEM book, November 22, 2008

By 

Joseph Feser (Berkeley, CA) - See all my reviews
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This review is from: Transmission Electron Microscopy and Diffractometry of Materials (Hardcover)

This is now my go-to source for TEM information. Its very readable, yet has loads of information about the specific modes and analysis of TEM data. Its a good book to learn from and a pretty good reference.