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Transmission Electron Microscopy and Diffractometry of Materials 3rd Edition

3 out of 5 stars 4 customer reviews
ISBN-13: 978-3540738855
ISBN-10: 3540738851
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Editorial Reviews

From the Back Cover

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’ Ronald Gronsky, University of California, Berkeley
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Product Details

  • Hardcover: 778 pages
  • Publisher: Springer; 3rd edition (November 1, 2009)
  • Language: English
  • ISBN-10: 3540738851
  • ISBN-13: 978-3540738855
  • Product Dimensions: 6.1 x 1.6 x 9.2 inches
  • Shipping Weight: 2.6 pounds
  • Average Customer Review: 3.0 out of 5 stars  See all reviews (4 customer reviews)
  • Amazon Best Sellers Rank: #2,540,891 in Books (See Top 100 in Books)

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Customer Reviews

Top Customer Reviews

Format: Hardcover Verified Purchase
The star-value is indicative of the quality of this textbook, if I were to rate Amazon's treatment of this book they would get a solid 5-stars.

This textbook is a useful supplement to someone who is well grounded in the physical principles of diffraction. A great deal of attention is given to the ins-and-outs of the mathematics under-riding various phenomena, but the physical interpretations of the mathematics are not nearly as clear. I would highly recommend this book to an individual with a working qualitative knowledge of TEM and diffraction who is seeking to better quantify his/her understanding, but would not advise someone unfamiliar with these topics to pick up this book as an introduction.

I also want to take a moment to wax poetic about the glories of Amazon. I accidentally ordered this book to my old West Philly apartment, all the way across the country from where I now reside. When I realized my error I contacted my old super and asked her to keep an eye out for the book so I could have it sent to my new home. It never appeared. Apparently the mail carrier thought it was a good idea to leave a package out on a doorstep where passerby could easily take it for further inspection later. When I called customer service and explained my plight, the representative I talked to was able to arrange to deliver me a new copy to the correct address at no additional cost. These people are wonderful and glorious and the experience has earned them my undying gratitude. Thanks again Amazon!
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Format: Hardcover Verified Purchase
I bought this book for a TEM/Diffraction class. A friend summed it up nicely: all the information you could want about TEM is in this book, but boy, do you have to dig for it.

Often rambling; hard to get the important concepts due to the large amount of verbose text. Problems in back of chapters often hard to solve unless you are making just the right assumptions. This is too bad, since Fultz's work is often interesting and his conversational style could be nice if it was reigned in a bit.

Get Willams and Carter for all practical purposes. The book from Goodhew, Humphreys, and Beanland is less mathematically rigorous than Fultz's but much more effective at getting concepts across. Egerton's book seems to be common, but I find it to be a bit too brief for me. There are a zillion TEM/Diffraction books out there, spend an afternoon in the library and choose one that suits your learning style.
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Format: Hardcover Verified Purchase
Well, the content of the book is excellent. But "print on demand" copies are being sold. Since the binding of "print on demand" copies is in general not as good as standard hardcover books, the information should be given honestly in the description of the book.
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Format: Hardcover
I cannot agree with the previous comments at all. Among all the books I've read in the area of materials characterization, this book is one of, if not, the most tedious one. Some concepts should have been explained in a much more concise and clear way. The description is very redundant and intimidating. The author fails to include more experimental contents but tells you where the sum of a geometric series comes from. Among many concepts and terms, the author smugly add much useless description which brings you nothing but headache. Other books, such as the famous TEM textbook by Williams and Carter, is obviously much much better than this one.
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