Customer Reviews

Transmission Electron Microscopy and Diffractometry of Materials

5 star:		(2)
4 star:		(0)
3 star:		(1)
2 star:		(0)
1 star:		(1)

 

 

I bought this book for a TEM/Diffraction class. A friend summed it up nicely: all the information you could want about TEM is in this book, but boy, do you have to dig for it.

Often rambling; hard to get the important concepts due to the large amount of verbose text. Problems in back of chapters often hard to solve unless you are making just the right assumptions. This is too bad, since Fultz's work is often interesting and his conversational style could be nice if it was reigned in a bit.

Get Willams and Carter for all practical purposes. The book from Goodhew, Humphreys, and Beanland is less mathematically rigorous than Fultz's but much more effective at getting concepts across. Egerton's book seems to be common, but I find it to be a bit too brief for me. There are a zillion TEM/Diffraction books out there, spend an afternoon in the library and choose one that suits your learning style.

I cannot agree with the previous comments at all. Among all the books I've read in the area of materials characterization, this book is one of, if not, the most tedious one. Some concepts should have been explained in a much more concise and clear way. The description is very redundant and intimidating. The author fails to include more experimental contents but tells you where the sum of a geometric series comes from. Among many concepts and terms, the author smugly add much useless description which brings you nothing but headache. Other books, such as the famous TEM textbook by Williams and Carter, is obviously much much better than this one.

This is now my go-to source for TEM information. Its very readable, yet has loads of information about the specific modes and analysis of TEM data. Its a good book to learn from and a pretty good reference.

This book is concise and comprehensive. Own it if you want to master TEM.