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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences,) [Hardcover]

Ludwig Reimer (Author)

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Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences)
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Book Description

ISBN-10: 3540625682 | ISBN-13: 978-3540625681 | Publication Date: May 16, 1997 | Edition: 4th

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

#outer_postBodyPS { display: none; } #psGradient { display: none; } #psPlaceHolder { display: none; } #psExpand { display: none; } Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Product Details

Hardcover: 584 pages
Publisher: Springer; 4th edition (May 16, 1997)
Language: English
ISBN-10: 3540625682
ISBN-13: 978-3540625681
Product Dimensions: 9.5 x 6.5 x 1.2 inches
Shipping Weight: 2.3 pounds
Amazon Best Sellers Rank: #5,755,499 in Books (See Top 100 in Books)

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Inside This Book (learn more)

First Sentence:
In a conventional transmission electron microscope (CTEM, or TEM for short) (Fig. 1.1), a thin specimen is irradiated with an electron beam of uniform current density. Read the first page

Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, Specimen Objective, Imaging of Single Atoms, Lattice Defects of Small Dimensions, Radiation Damage of Inorganic Specimens

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Citations (learn more)

This book cites 22 books:

Advances in Optical and Electron Microscopy, Vol. 8 by R. Barer in Back Matter (1), and Back Matter (2)
Advances in Optical and Electron Microscopy, Vol. 13 by Tom Mulvey in Back Matter
Laser Spectroscopy (International Conference on Laser Spectroscopy//Laser Spectroscopy) by A. R. W. McKellar in Back Matter
Holography and Deformation Analysis (Springer Series in Optical Sciences) by Walter Schumann in Front Matter
X-RAY MICROANALYSIS IN ELECTRON MICROSCOPY FOR BIOLOGIST (Microscopy Handbooks) by A. John Morgan in Back Matter

See all 22 books this book cites

6 books cite this book:

Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz on 9 pages
Microbial Growth in Biofilms, Part A: Developmental and Molecular Biological Aspects, Volume 336 (Methods in Enzymology) by Ron J. Doyle on page 320
Handbook of Microemulsion Science and Technology by Promod Kumar on page 435
Impact of Electron and Scanning Probe Microscopy on Materials by David G. Rickerby on page 104
Electronic Materials Chemistry by H. Bernahrd Pogge on page 412

See all 6 books citing this book

Books on Related Topics (learn more)

Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein

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Transmission Electron Microscopy by David B. Williams

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Scanning Electron Microscopy by Ludwig Reimer

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$Transmission Electron Microscopy and Diffractometry of Materials$

Transmission Electron Microscopy and Diffractometry of Materials by B. Fultz

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