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Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences) Hardcover – August 28, 2008

ISBN-13: 978-0387400938 ISBN-10: 0387400931 Edition: 5th

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Editorial Reviews


From the reviews of the fifth edition:

“A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. … the student and the instructor can find applications of many fundamental concepts of physics in this book. … could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. … In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy … .” (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)

From the Back Cover

Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated.

Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.

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