Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.
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From the reviews of the fifth edition: “A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. … the student and the instructor can find applications of many fundamental concepts of physics in this book. … could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. … In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy … .” (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)
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Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.
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Key Phrases - Statistically Improbable Phrases (SIPs):
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specimen damage, electron irradiation, lens aberrations, electron lenses, electron holography, finite illumination aperture, selector diaphragm, reduced defocus, filter entrance plane, atomic surface steps, specimen periodicity, electron spectroscopic diffraction, objective diaphragm, local mass thickness, useful specimen thickness, polepiece gap, imaging energy filter, exit wave function, carbon supporting film, gun brightness, specimen cartridge, indium crystals, inclined dislocations, small electron probes, positive phase contrast Key Phrases - Capitalized Phrases (CAPs): (learn more)
Transmission Electron Microscope, Elemental Analysis, Electron-Specimen Interactions, Theory of Electron Diffraction, Radiation Damage of Organic Specimens, Wave Optics of Electrons, Electron Energy-Loss Spectroscopy, Imaging of Single Atoms, High-Resolution Electron Microscopy, Electron-Diffraction Modes, Particle Optics of Electrons, Monte Carlo, Electron Guns, Multiple-Scattering Effects, Fundamentals of Crystallography, Element-Distribution Images, Wave-Optical Formulation of Imaging, Planar Lattice Faults, Scanning Transmission Electron Microscopy, Specimen Objective, Electron Diffraction Using, The Cliff-Lorimer, Alternative Types of Electron Microscopy, Lattice Defects of Small Dimensions, Three-Dimensional Reconstruction Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
specimen damage, electron irradiation, lens aberrations, electron lenses, electron holography, finite illumination aperture, selector diaphragm, reduced defocus, filter entrance plane, atomic surface steps, specimen periodicity, electron spectroscopic diffraction, objective diaphragm, local mass thickness, useful specimen thickness, polepiece gap, imaging energy filter, exit wave function, carbon supporting film, gun brightness, specimen cartridge, indium crystals, inclined dislocations, small electron probes, positive phase contrast Key Phrases - Capitalized Phrases (CAPs): (learn more)
Transmission Electron Microscope, Elemental Analysis, Electron-Specimen Interactions, Theory of Electron Diffraction, Radiation Damage of Organic Specimens, Wave Optics of Electrons, Electron Energy-Loss Spectroscopy, Imaging of Single Atoms, High-Resolution Electron Microscopy, Electron-Diffraction Modes, Particle Optics of Electrons, Monte Carlo, Electron Guns, Multiple-Scattering Effects, Fundamentals of Crystallography, Element-Distribution Images, Wave-Optical Formulation of Imaging, Planar Lattice Faults, Scanning Transmission Electron Microscopy, Specimen Objective, Electron Diffraction Using, The Cliff-Lorimer, Alternative Types of Electron Microscopy, Lattice Defects of Small Dimensions, Three-Dimensional Reconstruction Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
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