This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Transmission Electron Microscopy
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Book Description
Editorial Reviews
Review
`The best textbook for this audience available.'
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley
From the Back Cover
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment. Key Features: Undisputed market leader, now completely revised and updated Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists Explains why a particular technique should be used and how a specific concept can be put into practice Nearly 700 figures and diagrams, most in full color Praise for the first edition: `The best textbook for this audience available.' – American Scientist "...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" – Microscopy and Microanalysis `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
--This text refers to the
Hardcover
edition.
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Most Helpful Customer Reviews
16 of 16 people found the following review helpful:
5.0 out of 5 stars
An outsatnding textbook!,
By +++ (OR, United States) - See all my reviews
This review is from: Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) (Paperback)
I find this book probably the best textbook in materials science I ever read. Not only the authors are experts in the field of microscopy, but they also succeeded in extremely difficult task to present the complicated science of electron microscopy in a simple (but not oversimplified!) language. The book covers all major aspects of transmission electron microscopy, and contains excellent illustrations. This book is certainly a priceless asset for students. It is recommended as one of the best books at the beginning and intermediate level. If you are looking for a book to learn TEM, get this one, you will never regret!
9 of 9 people found the following review helpful:
5.0 out of 5 stars
Excellent introduction to TEM,
By cmpst52 "cmpst52" (Denton, NC United States) - See all my reviews
This review is from: Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) (Paperback)
In the 70's and 80's the book by Hirsch et al. was the TEM reference tome, and Eddington's book the applications manual.Time has marched on, and this book is the new replacement for both! Carter and Williams wrote a very easy to read, yet well detailed, text and reference for TEM. They cover quite literally everything, in just the right level of detail for 1st or 2nd year grad students. This book is the best way to get a quick grasp of TEM.
2 of 2 people found the following review helpful:
4.0 out of 5 stars
Top of the class,
By
This review is from: Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) (Paperback)
This 4-volume set of paperback books provides a thorough and readable introduction to the science and practice of TEM (transmission electron microscopy). The text is divided into short, digestable sections, each accompanied by figures, graphs and plots. The equations are numerous, but well explained and presented with minimal derivations but full explanations. The books are divided into concise sections making it easy for the reader to find what he/she needs. Overall, a perfect textbook to learn about TEM, and as a reference for those more experienced in this field.
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Inside This Book
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First Sentence:
When characterizing a specimen in the TEM, the limitations of only using imaging should by now be obvious to you. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
internal fluorescence peak, collection semiangle, output count rate, magnetic prism spectrometer, spectrometer entrance aperture, partial ionization cross section, input count rate, electron beam instruments, ionization edges, plural scattering, coherent bremsstrahlung, edge onset, minimum detectability, plasmon peak, quantitative microanalysis, bremsstrahlung intensity, thermionic source, jump ratio, dispersion plane, electron optics, collection angle, specimen drift, beam spreading, diffraction mode, detectability limits Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Plenum Press, Analytical Electron Microscopy, San Francisco, Monte Carlo, Van Cappellen, Academic Press, General References Goldstein, New Jersey, Philips Electron Optics Publishing Group, The Metals Society New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
When characterizing a specimen in the TEM, the limitations of only using imaging should by now be obvious to you. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
internal fluorescence peak, collection semiangle, output count rate, magnetic prism spectrometer, spectrometer entrance aperture, partial ionization cross section, input count rate, electron beam instruments, ionization edges, plural scattering, coherent bremsstrahlung, edge onset, minimum detectability, plasmon peak, quantitative microanalysis, bremsstrahlung intensity, thermionic source, jump ratio, dispersion plane, electron optics, collection angle, specimen drift, beam spreading, diffraction mode, detectability limits Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Plenum Press, Analytical Electron Microscopy, San Francisco, Monte Carlo, Van Cappellen, Academic Press, General References Goldstein, New Jersey, Philips Electron Optics Publishing Group, The Metals Society New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 29
books:
See all 29 books this book cites
12
books
cite this book:
See all 12 books citing this book
- Practical Analytical Electron Microscopy in Materials Science on 10 pages
- Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein on 5 pages
- Introduction to Analytical Electron Microscopy by John Hren on 5 pages
- Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology) by R.F. Egerton on 5 pages
- Principles of Analytical Electron Microscopy by Joseph Goldstein on 4 pages
See all 29 books this book cites
- Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz on 8 pages
- Materials Science:An Interactive Learning Tool for Students by Matter Project Team Staff on page 121, and page 126
- Impact of Electron and Scanning Probe Microscopy on Materials by David G. Rickerby on page 39, and page 104
- Impact of Electron and Scanning Probe Microscopy on Materials Research (NATO Science Series E: (closed)) by David G. Rickerby on page 39, and page 104
- Spontaneous Ordering in Semiconductor Alloys by Angelo Mascarenhas on page 233
See all 12 books citing this book
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