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Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set) Paperback – August 5, 2009

ISBN-13: 978-0387765020 ISBN-10: 0387765026 Edition: 2nd

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Product Details

  • Paperback: 760 pages
  • Publisher: Springer; 2nd edition (August 5, 2009)
  • Language: English
  • ISBN-10: 0387765026
  • ISBN-13: 978-0387765020
  • Product Dimensions: 11 x 8.3 x 2.4 inches
  • Shipping Weight: 6.5 pounds (View shipping rates and policies)
  • Average Customer Review: 4.7 out of 5 stars  See all reviews (25 customer reviews)
  • Amazon Best Sellers Rank: #213,880 in Books (See Top 100 in Books)

Editorial Reviews

Review

From the reviews of the second edition:

“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)

“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

From the Back Cover

This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment.

Key Features:

  • Undisputed market leader, now completely revised and updated
  • Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists
  • Explains why a particular technique should be used and how a specific concept can be put into practice
  • Nearly 700 figures and diagrams, most in full color

Praise for the first edition:

`The best textbook for this audience available.' – American Scientist

"...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" – Microscopy and Microanalysis

`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron

`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin

`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley


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Customer Reviews

4.7 out of 5 stars
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This is very good books that I suggest all the TEM users to read through it.
C. F. Dee
For the typical materials science upper class undergraduate or beginning graduate student, this textbook should serve as a good introduction.
Ulfilas
If you are looking for a book to learn TEM, get this one, you will never regret!
+++

Most Helpful Customer Reviews

16 of 16 people found the following review helpful By +++ on March 9, 2000
Format: Paperback
I find this book probably the best textbook in materials science I ever read. Not only the authors are experts in the field of microscopy, but they also succeeded in extremely difficult task to present the complicated science of electron microscopy in a simple (but not oversimplified!) language. The book covers all major aspects of transmission electron microscopy, and contains excellent illustrations. This book is certainly a priceless asset for students. It is recommended as one of the best books at the beginning and intermediate level. If you are looking for a book to learn TEM, get this one, you will never regret!
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9 of 9 people found the following review helpful By cmpst52 on March 22, 2002
Format: Paperback
In the 70's and 80's the book by Hirsch et al. was the TEM reference tome, and Eddington's book the applications manual.
Time has marched on, and this book is the new replacement for both!
Carter and Williams wrote a very easy to read, yet well detailed, text and reference for TEM. They cover quite literally everything, in just the right level of detail for 1st or 2nd year grad students.
This book is the best way to get a quick grasp of TEM.
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2 of 2 people found the following review helpful By Newton Ooi on April 26, 2006
Format: Paperback
This 4-volume set of paperback books provides a thorough and readable introduction to the science and practice of TEM (transmission electron microscopy). The text is divided into short, digestable sections, each accompanied by figures, graphs and plots. The equations are numerous, but well explained and presented with minimal derivations but full explanations. The books are divided into concise sections making it easy for the reader to find what he/she needs. Overall, a perfect textbook to learn about TEM, and as a reference for those more experienced in this field.
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1 of 1 people found the following review helpful By Blamman on February 17, 2010
Format: Hardcover Verified Purchase
I bought this book as soon as I found out I would likely get a job working with TEMs. I had already bought a very physics oriented book by Reimer that is also excellent, but this book is simply a joy to read. Ample color diagrams and real micrographs together with witty, keen narrative make it the first technical book in years that I have read till the wee hours of the morning. I think that if you can read the whole book and retain 90% of what you have read and have the opportunity to apply it in real life on an actual TEM then you will be able to call yourself a TEM expert of sorts.

I have found that reading the Reimer text together with this one makes a hard to beat combination. When the physics gets too tough in Reimer I take a break and read this text and get a better intuitive grasp of the material or an alternate derivation with a few less triple integrals, then delve back into Reimer with renewed vigor.

To the authors, I would like to buy you both a round of beers some day, this text is timely and I am glad to have found it when I did.
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1 of 1 people found the following review helpful By Steven on April 16, 2009
Format: Paperback
This textbook is a fantastic introduction to transmission electron microscopy because of the informal, lecture-like layout of each chapter. The authors do not assume anything more than a basic knowledge of physics and optics and so describe in vivid detail what is happening in each chapter. There are numerous informal comments and asides that evoke an informal tone, sorely missing from the many pompous textbooks that abound in this field.

I would highly recommend the text to anyone looking for a basic introduction to the different kinds of transmission electron microscopy available and a thorough treatment of the physics and optics of these microscopes.
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1 of 1 people found the following review helpful By got2ske on March 27, 2011
Format: Paperback Verified Purchase
As a graduate student who is currently taking a lab course and being trained in the art and science of TEM, I find this to be an excellent resource. Reading "Part 1 - Basics" as I became familiar with the instrument, and then moving on to the other more detailed sections as needed (Part II = Diffraction, Part III = Imaging, and Part IV = Analytical TEM) has helped immensely in understanding what I'm doing when working at the microscope.

I used Fultz & Howe, 3rd. edition for a TEM-theory class last semester; while it is also an excellent book (more rigorous in terms of theoretical basis and derivations), I find that Williams & Carter is a better place to start in getting acquainted with the many aspects of TEM. The large, color diagrams in the 2nd edition are also very helpful, and this is another aspect that distinguishes it from Fultz & Howe.
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Format: Paperback
Dave Williams and Barry Carter have done a good job assembling this introduction to transmission electron microscopy based on their long and active careers in teaching and research. For the typical materials science upper class undergraduate or beginning graduate student, this textbook should serve as a good introduction. Teaching this complex and multifaceted technique is a herculean task--let alone writing a text book! That said, this is not the kind of book that I would have preferred as a novice in this field. I usually prefer books that concentrate on the more difficult and mathematically challenging concepts and leave other topics to anthologies such as this book or to review articles. Although this book gives a pretty reasonable introduction to the Howie-Whelan equations, it does not really go into Cowley-Moodie mulitislice theory. This is to be expected really, since understanding multislice theory requires the reader to have a stronger physics and mathematics background than that possessed by most materials scientists. However, for the student who is already quite familiar with the Schrodinger equation and has the equivalent of a B.S. in physics (as I did when I started materials science grad school) I would recommend Marc De Graef's book Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series) as a more satisfying introduction to TEM (and which addresses both the Howie-Whelan and multislice approaches--as well as the unifying concept of the Sturkey scattering matrix). After reading De Graef's book you can then read Williams and Carter for an introduction to many other important topics.
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