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4 of 5 people found the following review helpful:
5.0 out of 5 stars
Practical Book,
By Darth Vadar (Silicon Valley, California) - See all my reviews
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This review is from: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) (Hardcover)
This is a great book for Test/DFT engineers and EDA engineers developing test tool. It gives a thorough review of lot of concepts and techniques employed in practice which cannot be found if you look at a general testing book. This also makes it an excellent resource to prepare for interviews.
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) by Xiaoqing Wen (Hardcover - July 21, 2006)
$80.95 $59.83
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