X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique is possible not only in a static state but also in a dynamic state (in-situ condition). The XAFS can provide information that is not possible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide molecular-level approach to mechanistic study for understanding of catalysts and developing of catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The fields of XAFS are now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book is intended for the widest range of researchers and students working in the domain or related topics.
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