X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics) [Hardcover]

Metin Tolan (Author)

Book Description

Publication Date: April 15, 1999 | ISBN-10: 3540651829 | ISBN-13: 978-3540651826

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

Editorial Reviews

Review

"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2

Product Details

• Hardcover: 197 pages
• Publisher: Springer (April 15, 1999)
• Language: English
• ISBN-10: 3540651829
• ISBN-13: 978-3540651826
• Product Dimensions: 9.8 x 6.2 x 0.8 inches
• Shipping Weight: 1.1 pounds
• Amazon Best Sellers Rank: #2,491,959 in Books (See Top 100 in Books)

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