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X-Ray Spectrometry: Recent Technological Advances
 
 
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X-Ray Spectrometry: Recent Technological Advances [Hardcover]

Kouichi Tsuji (Editor), Jasna Injuk (Editor), René Van Grieken (Editor)

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Book Description

047148640X 978-0471486404 May 3, 2004 1
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry.
  • Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays
  • Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends
  • Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields
  • Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications

This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.


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Editorial Reviews

From the Back Cover

During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray spectrometry. This progress includes considerable technological improvements in the design and production of detectors as well as significant advances in x-ray optics, special configurations and computing approaches. All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future.

The book is divided into the following sections:

  • Introduction
  • X-Ray Sources
  • X-Ray Optics
  • X-Ray Detectors
  • Special Configurations
  • New Computerization Methods
  • New Applications

each covering the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays. By its nature, such a book cannot cover the fundamental, well-known and more routine aspects of the technique; for this, reference is made to seve ral existing handbooks and textbooks. Each chapter is prepared by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields.

This book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.


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Inside This Book (learn more)
First Sentence:
Basic X-ray spectrometry (XRS) is, of course, not a new technique. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
gas proportional scintillation counter, polycapillary focusing optic, radioisotope measurement applications, polycapillary optics, light from bending magnets, multilayer supermirror, peak shape correction, pilot membrane, reduced electric field intensity, flux density gain, scintillation region, secondary scintillation, readout node, cryogenic microcalorimeters, fourth generation sources, ohmic side, full depletion voltage, microfocus source, new synchrotron radiation sources, polycapillary lenses, energy recovery linac, strip detectors, silicon drift detectors, weak thermal link, third generation sources
Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, Monte Carlo, New York, Synchrotron Rad, X-Ray Spectrom, Recent Technological Advances, Van Espen, Elsevier Science, Van Cappellen, Methods Phvs, Bergmann Tiest, Electron Spectrosc, Forensic Sci, Trace Microprobe Tech, University of Antwerp, Plenum Press, X-ray Chem, American Chemical Society, User Exp, X-Ray Anal, American Institute of Physics, Conf Proc, Health Perspect, Interface Anal, Marcel Dekker
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