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Scanning Probe Microscopy: The Lab on a Tip 2004th Edition

4 out of 5 stars 1 customer review
ISBN-13: 978-3540431800
ISBN-10: 3540431802
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Product Details

  • Series: Advanced Texts in Physics
  • Hardcover: 210 pages
  • Publisher: Springer; 2004 edition (October 10, 2003)
  • Language: English
  • ISBN-10: 3540431802
  • ISBN-13: 978-3540431800
  • Product Dimensions: 9.6 x 6.4 x 0.7 inches
  • Shipping Weight: 1.1 pounds (View shipping rates and policies)
  • Average Customer Review: 4.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #1,253,648 in Books (See Top 100 in Books)

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Format: Hardcover
Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer covers the two main techniques of SPM: STM and AFM (here called SFM). There is also a detailed section on Magnetic Force Microscopy(MFM). There are shorther sections on the less well known techniques, i.e. friction force microsocpy, SNOM, etc. The books covers the theory well, and is reasonably up to date as I write in 2007. The figures are clear, and the few microgrpahs presented in clear greyscale. There are relatively few applications, but these are easy to find elsewhere. Overall, a great book for the theory of SPM.
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