Jitter, Noise, and Signal Integrity at High-Speed (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library) (Hardcover)

by Mike Peng Li (Author)
Key Phrases: tailfit method, jitter separation methods, link jitter budget, International Test Conference, Third-Order Phase Locked Loop, Jitter Separation Based (more...)

Editorial Reviews

Product Description

State-of-the-art JNB and SI Problem-Solving: Theory, Analysis, Methods, and Applications

 

Jitter, noise, and bit error (JNB) and signal integrity (SI) have become today‘s greatest challenges in high-speed digital design. Now, there’s a comprehensive and up-to-date guide to overcoming these challenges, direct from Dr. Mike Peng Li, cochair of the PCI Express jitter standard committee.

 

One of the field’s most respected experts, Li has brought together the latest theory, analysis, methods, and practical applications, demonstrating how to solve difficult JNB and SI problems in both link components and complete systems. Li introduces the fundamental terminology, definitions, and concepts associated with JNB and SI, as well as their sources and root causes. He guides readers from basic math, statistics, circuit and system models all the way through final applications. Emphasizing clock and serial data communications applications, he covers JNB and SI simulation, modeling, diagnostics, debugging, compliance testing, and much more.

 

Coverage includes 

• JNB component classification, interrelationships, measurement references, and transfer functions
• Statistical techniques and signal processing theory for quantitatively understanding and modeling JNB and related components
• Jitter, noise, and BER: physical/mathematical foundations and statistical signal processing views
• Jitter separation methods in statistical distribution, time, and frequency domains
• Clock jitter in detail: phase, period, and cycle-to-cycle jitter, and key interrelationships among them
• PLL jitter in clock generation and clock recovery
• Jitter, noise, and SI mechanisms in high-speed link systems
• Quantitative modeling and analysis for jitter, noise, and SI
• Testing requirements and methods for links and systems
• Emerging trends in high-speed JNB and SI

As data rates continue to accelerate, engineers encounter increasingly complex JNB and SI problems. In Jitter, Noise, and Signal Integrity at High-Speed, Dr. Li provides powerful new tools for solving these problems–quickly, efficiently, and reliably.

 

Preface xv

Acknowledgements xxi

About the Author xxiii

 

Chapter 1: Introduction 1

Chapter 2: Statistical Signal and Linear Theory for Jitter, Noise, and Signal Integrity 27

Chapter 3: Source, Mechanism, and Math Model for Jitter and Noise 75

Chapter 4: Jitter, Noise, BER (JNB), and Interrelationships 109

Chapter 5: Jitter and Noise Separation and Analysis in Statistical Domain 131

Chapter 6: Jitter and Noise Separation and Analysis in the Time and Frequency Domains 163

Chapter 7: Clock Jitter 185

Chapter 8: PLL Jitter and Transfer Function Analysis 209

Chapter 9: Jitter and Signal Integrity Mechanisms for High-Speed Links 253

Chapter 10: Modeling and Analysis for Jitter and Signaling Integrity for High-Speed Links 281

Chapter 11: Testing and Analysis for Jitter and Signaling Integrity for High-Speed Links 309

Chapter 12: Book Summary and Future Challenges 345

 

Index 353

 

 

About the Author

Dr. Mike Peng Li was the Chief Technology Officer (CTO) with Wavecrest. He is now a Principle Architecture/Distinguished Engineer with Altera. Dr. Li pioneered the jitter separation method (Tailfit); deterministic jitter (DJ), random jitter (RJ), and total jitter (TJ) concept and theory formation; and the jitter transfer function (JTF) concept, theory, and application for high-speed serial link analysis. He has set and contributed to standards for jitter, noise, and signal integrity for leading serial data communications, such as Fibre Channel, Gigabit Ethernet, Serial ATA, PCI Express, FB DIMM, and International Technology Roadmap for Semiconductors (ITRS). He has been the cochairman of the PCI Express jitter standard committee. Dr. Li has been involved in technical committees for IEEE- and IEC-sponsored technical conferences, such as International Test Conference (ITC) and DesignCon. He is a frequent speaker, invited author/speaker, panelist, and session and panel chair on the subjects of jitter/noise and signal integrity, covering both design and testing. He has received many awards, including a design paper award from DesignCon/IEC and a contribution award from PCI-SIG. He has been listed in Who’s Who in America and Who’s Who in the World since 2006.

            Dr. Li has more than 15 years of experience in high-speed-related measurement instrumentation, testing, and analysis/modeling algorithms and tools, with applications in IC, microprocessor, clock, serial data communications for electrical and optical, and wireless communication. He has a BS in physics from the University of Science and Technology in China and an MSE in electrical engineering and a PhD in physics from the University of Alabama in Huntsville. He did his post-doctorate work at the University of California, Berkeley, where he worked as a research scientist on high-energy astrophysics before he joined industry. Dr Li has published more than 80 papers in refereed technical journals and conferences. He has filed 12 patents, with four granted and eight pending. He was the executive editor for Design and Test for Multiple Gbps Communication Devices and Systems and wrote two contributing chapters on jitter, signal integrity, and high-speed I/O design and testing for two books.

 

 

Product Details

• Hardcover: 400 pages
• Publisher: Prentice Hall PTR; 1 edition (November 29, 2007)
• Language: English
• ISBN-10: 0132429616
• ISBN-13: 978-0132429610
• Product Dimensions: 9.3 x 7.2 x 1.2 inches
• Shipping Weight: 2.2 pounds (View shipping rates and policies)
• Average Customer Review: 4.7 out of 5 stars See all reviews (6 customer reviews)
• Amazon.com Sales Rank: #421,578 in Books (See Bestsellers in Books)

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• This item is part of The Prentice Hall Modern Semiconductor Design Series Series.

Customer Reviews

Most Helpful Customer Reviews

11 of 11 people found the following review helpful:

3.0 out of 5 stars not up to the hype, December 26, 2007

By	JM "Derek" (Germany) - See all my reviews

The jitter area was really needing some new books and altough this book should be added to the library of any engineer working on jitter (there are not that many) it does fall short from what the author promisses. He does present a good initial discussion on the different types of jitter but the presented mathematical framework (mainly based on linear system theory) is very dry (sometimes of no use apart from some formalism) and provides little help to the engineer doing real work. More important the author basically presents mainly presents his work and forgets a significant large amount of published work from other people (for a first book on jitter in several years the reference sections are very very poor). The Signal Integrity aspect the book is extremly poor and the loopback testing section is useless (again forgeting a lot of industry work already available).

Unbelievable also is no in dept discussion on the jitter details of any standards (PCI expres, etc...) altough the author was part of some those comittes. The arguments presented against the BER Q based jitter separation algortithm are strange (he states that since an erfc() function is not part of the C++ standard library it is not easy to write the code !!! There are several free implementations of the erfc() function available) for good and bad this is the algorithm on the PCI Express II standard and just because he is not the inventor of the algorithm we engineers need to use it and a fair and wider discussion was needed.

The text does contain some errors and for a book that has so many equations the author should have used a word processor that could make the text/equations more easy to read (e.g. latex) and not MS word.

But at the moment there is not to much in the jitter area in book form. So if you have the time to spend on it go ahead.

3 of 4 people found the following review helpful:

5.0 out of 5 stars Jitter, Noise, and Signal Integrity at High-Speed, February 25, 2008

By	Wenliang Chen (TX USA) - See all my reviews (REAL NAME)

This book covers the state-of-the-art knowledge in high-speed wireline communication, including jitter analysis, system architecture, clock and PLL fundamentals as well as many more critical and advanced topics. It addresses cutting edge technology in the fields of design, modeling, and verification. It is one of the best books and must have so far in this area. Dr. Li's instrumental book can provide students, engineers, or researchers solid knowledge to understand, design and test high-speed
serial interfaces.

2 of 3 people found the following review helpful:

5.0 out of 5 stars New Base-Line Book, March 6, 2008

By	R. Ross - See all my reviews (REAL NAME)

Statistical methods are being combined with signal integrity methods for high-speed, high data rate, lossy
channel design. This book becomes a valuable resource for defining, classifying and providing the
mathematical basis and graphical insight for jitter and noise terminology and the related techniques that
are now becoming commonplace in EDA tools, presentations, application notes, and used in several standards.
Even IBIS is adding an algorithm modeling interface feature to help access propretary information provided
by semiconductor vendors for more efficient channel analysis and design optimization.

Some inconsistent font sizing within equations and elsewhere are annoying. However, the book's primary
value is that it becomes a new base-line for general and reasonably comprehensive information on jitter
and noise methodology for today's needs and future advances.