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Atom Probe Field Ion Microscopy (Monographs on the Physics and Chemistry of Materials)
 
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Atom Probe Field Ion Microscopy (Monographs on the Physics and Chemistry of Materials) (Hardcover)

by M. K. Miller (Author), A. Cerezo (Author), the late M. G. Hetherington (Author), G. D. W. Smith (Author)
5.0 out of 5 stars See all reviews (1 customer review)


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Editorial Reviews

Review
`The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level.' T. Mulvey, Measurement Science Technology 8 (1997)

`For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.' Aslib Book Guide, vol.61, no.12, December 1996.

Product Description
The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic- scale science and technology. This book gives a definitive and up-to-date_ account of the field, and is written by leading authorities on the _ subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of -the art account of this important field, and is intended for a graduate- level readership.

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Product Details

  • Hardcover: 532 pages
  • Publisher: Oxford University Press, USA (November 28, 1996)
  • Language: English
  • ISBN-10: 0198513879
  • ISBN-13: 978-0198513872
  • Product Dimensions: 9.4 x 6.3 x 1.4 inches
  • Shipping Weight: 2.2 pounds
  • Average Customer Review: 5.0 out of 5 stars See all reviews (1 customer review)
  • Amazon.com Sales Rank: #2,335,880 in Books (See Bestsellers in Books)


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5.0 out of 5 stars Excellent reference for field ion microscopy, February 12, 2005
This book provides an in-depth and highly understandable analysis of field ion microscopy.
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