Scanning Electron Microscopy and X-ray Microanalysis (Hardcover)

by Joseph Goldstein (Author), Dale E. Newbury (Author), David C. Joy (Author), Charles E. Lyman (Author), Patrick Echlin (Author), Eric Lifshin (Author), L.C. Sawyer (Author), J.R. Michael (Author) "The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale..." (more)
Key Phrases: initial electron beam energy, gas path length, slushy nitrogen, Monte Carlo, New York, San Francisco (more...)

Editorial Reviews

Review
"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005 "As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. An enhancement CD gives useful database and more detailed discussions on some equations. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." (Microscopy and Microanalysis, 9:5 (October 2003)

Product Description
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This is the third edition of this highly acclaimed text and has been extensively revised. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe. The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis.

See all Editorial Reviews

Product Details

• Hardcover: 689 pages
• Publisher: Springer; 3rd edition (February 2003)
• Language: English
• ISBN-10: 0306472929
• ISBN-13: 978-0306472923
• Product Dimensions: 10.1 x 7.2 x 1.3 inches
• Shipping Weight: 3.6 pounds (View shipping rates and policies)
• Average Customer Review: 4.9 out of 5 stars See all reviews (7 customer reviews)
• Amazon.com Sales Rank: #309,204 in Books (See Bestsellers in Books)

  Popular in these categories: (What's this?)

  #6 in	Books > Science > Biological Sciences > Microscopy & Techniques
  #6 in	Books > Science > Experiments, Instruments & Measurement > Electron Microscopes & Microscopy
  #36 in	Books > Science > Experiments, Instruments & Measurement > Microscopes & Microsocopy

Customer Reviews

Most Helpful Customer Reviews

3 of 3 people found the following review helpful:

5.0 out of 5 stars The Bible of All Scanning Electron Microscopy Books, September 20, 2008

By	Phillip "amazon_phil" (Philadephia, PA) - See all my reviews

If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you.

Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information.

1 of 1 people found the following review helpful:

5.0 out of 5 stars Awsome book for Scanning Electron Microscopy and X-Ray Analysis, March 10, 2006

By	Anant Raina (Lafayette, LA, USA) - See all my reviews (REAL NAME)

This book covers almost all aspects of the subject and the CD attached covers the recent development in the field.
This is the book one should have for the subject.

4.0 out of 5 stars Excellent outline of SEM and X-Ray microanalysis, February 25, 2008

By	Marcus V. D. Remus (Brazil) - See all my reviews (REAL NAME)

This book is a comprehensible review of principles and methods of SEM and X-ray microanalysis write in a single and elegant language. The authors avoid using mathematical formulas in the description and demonstration which turn it an atractive book to all scientists and even the beginners.