Applied Reliability, Second Edition (Electrical Engineering) (Hardcover)

by Paul A. Tobias (Author), David C. Trindade (Author) "One of the most useful skills a reliability specialist can develop is the ability to convert a mass (mess?) of data into a form suitable..." (more)
Key Phrases: Solution First, Confidence Coefficient, Graph of Percent Defective (more...)

Editorial Reviews

Product Description
With over 170 pages of new material, the second edition of this widely used reference provides engineers and statisticians with an updated, easy-to-follow approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced leading-edge reliability techniques. It includes an extensive treatment of life distribution and accelerated testing models and data analysis and data simulation techniques, as well as quality control methods and algorithms used to predict component and assembly field reliability.The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs.In addition, this latest edition offers hundreds of new example, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods.In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control.

About the Author
Retired, Austin, Texas, USA Sun Microsystems, Inc., Palo Alto, California, USA --This text refers to the Hardcover edition.

Product Details

• Hardcover: 424 pages
• Publisher: Chapman & Hall/CRC; 2 edition (January 1, 1995)
• Language: English
• ISBN-10: 0442004699
• ISBN-13: 978-0442004699
• Product Dimensions: 9.3 x 6 x 1.1 inches
• Shipping Weight: 1.6 pounds (View shipping rates and policies)
• Average Customer Review: 2.5 out of 5 stars See all reviews (2 customer reviews)
• Amazon.com Sales Rank: #749,982 in Books (See Bestsellers in Books)

Customer Reviews

Most Helpful Customer Reviews

23 of 23 people found the following review helpful:

4.0 out of 5 stars A very good book, but contains some annoying typing errors, August 10, 1997

By A Customer

A book with a very application oriented treatment of reliability, based on electronics industries experience. It uses an advanced style of explanation, i.e. assumes that readers have mastered certain topics/knowledge/techniques in reliability. However, prerequisites for reading this book must be clearly stated; i.e. what basics are required, are the basics given in the books enough, etc. Some typos appear in description of table/figure (i.e. table 6.7 written as table 1.7). Also some computational errors appeared in the answers to selected problems. These are indeed small errors, however they detract from a good book's image. Especially for new students in reliability and would-be practicioners, the answers to the problems in the book are very necessary to provide concept/technique mastery and understanding check. Why do not the authors provide answers to ALL problems? One possible thing to add to the contents is the design of reliability experiments, i.e. the general concepts and some examples drawn from some areas of interest (mechanical, electrical).

0 of 1 people found the following review helpful:

1.0 out of 5 stars Tobias and Trindade on Reliability, April 17, 2008

By	Chet Haibel (Langley, WA USA) - See all my reviews (REAL NAME)

This book starts with the dryest end of statistics possible, probability theory. It is fairly mathematical throughout, and I didn't find it easy to read. It's got a lot of good content, but not presented very well.