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Optical Metrology
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Product Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
* End-of-chapter problems.
From the Back Cover
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
* End-of-chapter problems.
From the Back Cover
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
Features include:
- A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
- Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
- Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
- Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
- A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.
- End-of-chapter problems and solutions.
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Inside This Book
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First Sentence:
Before entering into the different techniques of optical metrology some basic terms and definitions have to be established. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
digital speckle photography, digital fringe pattern measurement techniques, plane polariscope, reconstructed object wave, coherent transfer function, quarterwave plate, fringe localization, circular polariscope, speckle displacement, shadow moiré, autocorrelation theorem, filter plane, afocal system, reconstructed wave, optical metrology, amplitude hologram, digital holography, principal stress difference, temporal degree, fringe period, hologram plate, reconstruction wave, cavity dumping, fringe maximum, speckle size Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Prentice Hall, John Wiley, Academic Press, Englewood Cliffs New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Before entering into the different techniques of optical metrology some basic terms and definitions have to be established. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
digital speckle photography, digital fringe pattern measurement techniques, plane polariscope, reconstructed object wave, coherent transfer function, quarterwave plate, fringe localization, circular polariscope, speckle displacement, shadow moiré, autocorrelation theorem, filter plane, afocal system, reconstructed wave, optical metrology, amplitude hologram, digital holography, principal stress difference, temporal degree, fringe period, hologram plate, reconstruction wave, cavity dumping, fringe maximum, speckle size Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Prentice Hall, John Wiley, Academic Press, Englewood Cliffs New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 45
books:
See all 45 books this book cites
9
books
cite this book:
See all 9 books citing this book
- Solid State Imaging (NATO Science Series E:) by P. Jespers on page 140, page 141, and Back Matter
- Introduction to Fourier Optics by Joseph W. Goodman in Back Matter (1), Back Matter (2), and Back Matter (3)
- Holographic Interferometry (Wiley Series in Pure and Applied Optics) by Charles M. Vest on page 157, and page 168
- Fiber Optic Communications (5th Edition) by Joseph C. Palais on page 311, and page 314
- Fundamentals of Photonics by Bahaa E. A. Saleh on page 116, and Back Matter
See all 45 books this book cites
- Optical Shop Testing (Wiley Series in Pure and Applied Optics) by Daniel Malacara on page 644, and page 682
- Interferometry in Speckle Light: Theory and Applications by P. Jacquot on page 592
- MATLAB(R) for Photomechanics- A Primer by A. Asundi in Back Matter
- Optical Methods of Measurement: Wholefield Techniques (Optical Science and Engineering) by Rajpal S. Sirohi on page 273
- Optomechatronics: Fusion of Optical and Mechatronic Engineering (Mechanical Engineering) by Hyungsuck Cho on page 103
See all 9 books citing this book
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