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Product Description

With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD.

ESD: RF Technology and Circuits:

  • Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips;
  • discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting;
  • examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology;
  • gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems;
  • highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry;
  • sets out examples of RF ESD design computer aided design methodologies;
  • covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts.

Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.



From the Back Cover

With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD.

ESD: RF Technology and Circuits:

  • Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips;
  • discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting;
  • examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology;
  • gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems;
  • highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry;
  • sets out examples of RF ESD design computer aided design methodologies;
  • covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts.

Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.


Product Details

  • Hardcover: 420 pages
  • Publisher: Wiley (October 23, 2006)
  • Language: English
  • ISBN-10: 0470847557
  • ISBN-13: 978-0470847558
  • Product Dimensions: 9.8 x 6.8 x 1.2 inches
  • Shipping Weight: 2 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (3 customer reviews)
  • Amazon.com Sales Rank: #1,653,001 in Books (See Bestsellers in Books)

More About the Author

Steven H. Voldman
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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
power clamp circuit, extrinsic base implant, hierarchical parameterized cells, latchup robustness, application frequency increases, bipolar power clamp, phantom emitter, unity current gain cutoff frequency, diode string network, power clamps, alternative current loop, power clamp network, ballasting element, bipolar current gain, guard ring efficiency, power gain cutoff frequency, series inductor element, total capacitance load, discharge protection device, equivalent capacitance load, salicide film, power design point, current cutoff frequency, series resistor element, mixed voltage applications
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Proceedings of the Electrical Overstress, John Wiley, Electron Devices, Proceedings of the International Reliability Physics, Electron Device Letters, New York, Proceedings of the Bipolar, International Electron Device Meeting, Technical Digest, Applied Physics Letters, Journal of Electrostatics, Substrate Figure, International Symposium, Journal of Applied Physics, Nuclear Science, Stretch Stretch Type, Artech House, Tutorial Notes of the Electrical Overstress, Collector Base Emitter, Formulation of the S-parameter, Instance Name, Journal of Solid State Circuits, Journal of Solid-State Circuits, Physical Review, Post-stress S-parameter
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What Do Customers Ultimately Buy After Viewing This Item?

ESD : RF Technology and Circuits
58% buy the item featured on this page:
ESD : RF Technology and Circuits 5.0 out of 5 stars (3)
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ESD: Circuits and Devices
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Basic ESD and I/O Design
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Customer Reviews

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Most Helpful Customer Reviews

 
5.0 out of 5 stars Excellent Comprehensive Series, June 5, 2009
By Shye Shapira (Tivon, Israel) - See all my reviews
(REAL NAME)   


Dr. Voldmans ESD and Latchup book Series is an excellent reference. I recommend them to engineers in my department who indeed use them with great success.
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5.0 out of 5 stars A very good ESD book about RF ESD design, January 23, 2008
By L. Lou (Orlando, Florida, USA) - See all my reviews
I have already had this book for a while. This one is the third book of the author's ESD book series which cover the most comprehensive topics related to ESD protection comparing with other ESD books. This one is also the only ESD book focusing on RF technology and circuits and it comes at the time when a growing interest is observed in ESD in RF technology and applications. RF ESD design is different and tough. This book gives a clear picture of how the RF ESD design is distinct from the basic ESD design practices, and then tells you how to design ESD protection for different RF applications. It has good amount of examples and plenty of new and updated data points and the latest developments in the field. I also like the way the author expose the reader to the patent art in the ESD field. The more my knowledge grew, the more I have appreciated returning to this book as a reference. I always keep it at hand for my ESD design projects.
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5.0 out of 5 stars Great series for ESD education!, January 18, 2008
By Chen (California, USA) - See all my reviews
This book, ESD: RF Technology and Circuits, is part of a 3-book series on Electrostatic Discharge (ESD) by the same author (Steven Voldman).

One of the main strengths of this series (and there are very many) is that this is very recently published with new and updated datapoints, not to mention being the only series of ESD textbook. Essentially, this means that all the latest developments in the field is published in an easy-to-understand series.

In this book, Voldman writes about the design of ESD protection circuits for RF designs in his unique style which is illuminating both for experts and beginners alike. ESD design for RF parts is highly complex, and a lot of the tricks and tips needed for high performance protection circuits are collected in this book. I highly recommend this book series to all students of integrated circuit design and ESD.
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