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Editorial Reviews
Review
"Recommended for upper-division undergraduates through professional scientists in chemistry, materials science, physics, and biology." (Choice, Vol. 38, No. 10, June 2001)
"My overall impression of this book was positive." (The Alchemist, 4 September, 2001)
Product Description
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines
Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies.
Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices.
This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology.
Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
See all Editorial Reviews
"Recommended for upper-division undergraduates through professional scientists in chemistry, materials science, physics, and biology." (Choice, Vol. 38, No. 10, June 2001)
"My overall impression of this book was positive." (The Alchemist, 4 September, 2001)
Product Description
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines
Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies.
Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices.
This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology.
Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
See all Editorial Reviews
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Inside This Book
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First Sentence:
Scanning probe microscopy (SPM) is unique among imaging techniques in that it provides three-dimensional (3-D) real-space images and among surface analysis techniques in that it allows spatially localized measurements of structure and properties. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
tunneling distribution, ballistic hole spectroscopy, voltage modulation techniques, ballistic holes, ferromagnetic tip, resistance microscopy, tunneling spectroscopy data, unit mesh vectors, interfacial stiffness, tunneling spectroscopy measurements, positive sample bias, tunneling spectra, tunnel voltage, tunneling transmission probability, isolation assembly, negative sample bias, driven cantilever, contact mode imaging, tip bias, bending signal, first harmonic signal, inelastic tunneling spectroscopy, measured barrier height, hole spectra, acoustic drive Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Surface Sci, Academic Press, John Wiley, Digital Instruments, Interfacial Electrochem, Oxford University Press, Cambridge University Press, Color Plate, Elsevier Science, Interface Sci, Kluwer Academic Publishers, Marcel Dekker, Van Hove, Dan Dahlberg, Physical Structure, Santa Barbara, Thin Solid Films, Boca Raton, Electroanalytical Chemistry, Interface Anal, Bohr Figure, Mater Sci, Physics of Semiconductor Devices, Plenum Press New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Scanning probe microscopy (SPM) is unique among imaging techniques in that it provides three-dimensional (3-D) real-space images and among surface analysis techniques in that it allows spatially localized measurements of structure and properties. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
tunneling distribution, ballistic hole spectroscopy, voltage modulation techniques, ballistic holes, ferromagnetic tip, resistance microscopy, tunneling spectroscopy data, unit mesh vectors, interfacial stiffness, tunneling spectroscopy measurements, positive sample bias, tunneling spectra, tunnel voltage, tunneling transmission probability, isolation assembly, negative sample bias, driven cantilever, contact mode imaging, tip bias, bending signal, first harmonic signal, inelastic tunneling spectroscopy, measured barrier height, hole spectra, acoustic drive Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Surface Sci, Academic Press, John Wiley, Digital Instruments, Interfacial Electrochem, Oxford University Press, Cambridge University Press, Color Plate, Elsevier Science, Interface Sci, Kluwer Academic Publishers, Marcel Dekker, Van Hove, Dan Dahlberg, Physical Structure, Santa Barbara, Thin Solid Films, Boca Raton, Electroanalytical Chemistry, Interface Anal, Bohr Figure, Mater Sci, Physics of Semiconductor Devices, Plenum Press New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 42
books:
See all 42 books this book cites
2
books
cite this book:
- Physics of Semiconductor Devices by Simon M. Sze on page 42, page 248, and page 286
- Semiconductor Devices by S.M. Sze on page 42, page 248, and page 286
- Intermolecular and Surface Forces, Second Edition: With Applications to Colloidal and Biological Systems (Colloid Science) by Jacob N. Israelachvili in Front Matter, page 42, and page 365
- Surface Forces by Nikolai V. Churaev in Front Matter, and page 332
- Scanning Tunneling Microscopy (Experimental Methods in the Physical Sciences) by Joseph A. Stroscio on page 43, and page 56
See all 42 books this book cites
- Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute ... II: Mathematics, Physics and Chemistry) by Paula M. Vilarinho on page 241
- Morphology of Condensed Matter: Physics and Geometry of Spatially Complex Systems (Lecture Notes in Physics) by Klaus R. Mecke on page 105
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