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Editorial Reviews
Review
"Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners." -- Choice, Vol. 38, No. 7, March 2001
Product Description
A pragmatic approach to testing electronic systems
As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.
Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied
to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:
* An explanation of where a test belongs in the design flow
* Detailed discussion of scan-path and ordering of scan-chains
* BIST solutions for embedded logic and memory blocks
* Test methodologies for FPGAs
* A chapter on testing system on a chip
* Numerous references
As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.
Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied
to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:
* An explanation of where a test belongs in the design flow
* Detailed discussion of scan-path and ordering of scan-chains
* BIST solutions for embedded logic and memory blocks
* Test methodologies for FPGAs
* A chapter on testing system on a chip
* Numerous references
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Inside This Book
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First Sentence:
The reliability of electronic systems is no longer a concern limited to the military, aerospace, and banking industries, where failure consequences may have catastrophic impact. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
pseudorandom test pattern generation, test point insertion, test application time, test pattern source, test access mechanism, aliasing probability, testing sequential circuits, exhaustive test set, bridging faults, testability measures, response compaction, coupling faults, test wrapper, space compaction, gate oxide shorts, synthesis for testability, fault list, scan chain, homing sequence, signature analyzer, fault coverage, parity tree, bypass register, testing microprocessors, leakage faults Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Comput, Design Automation Conference, New York, Kluwer Academic, Prentice Hall, Upper Saddle River, International Conference, Test Symposium, Theory Appl, Computer Design, Computer Society, University of California, Computer Science Press, Digest of Papers, Digital System Design, Electron Devices, Fault-Tolerant Computing, Operation Gate, Principles of Logic Design, San Jose, Santa Clara, Solid State Circuits, The Synthesis Approach, Artech House, Core Core Core New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
The reliability of electronic systems is no longer a concern limited to the military, aerospace, and banking industries, where failure consequences may have catastrophic impact. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
pseudorandom test pattern generation, test point insertion, test application time, test pattern source, test access mechanism, aliasing probability, testing sequential circuits, exhaustive test set, bridging faults, testability measures, response compaction, coupling faults, test wrapper, space compaction, gate oxide shorts, synthesis for testability, fault list, scan chain, homing sequence, signature analyzer, fault coverage, parity tree, bypass register, testing microprocessors, leakage faults Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Comput, Design Automation Conference, New York, Kluwer Academic, Prentice Hall, Upper Saddle River, International Conference, Test Symposium, Theory Appl, Computer Design, Computer Society, University of California, Computer Science Press, Digest of Papers, Digital System Design, Electron Devices, Fault-Tolerant Computing, Operation Gate, Principles of Logic Design, San Jose, Santa Clara, Solid State Circuits, The Synthesis Approach, Artech House, Core Core Core New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 54
books:
See all 54 books this book cites
4
books
cite this book:
- Logic Testing and Design for Testability (Computer Systems Series) by Hideo Fujiwara on 6 pages
- Digital Systems Testing & Testable Design by Miron Abramovici on 4 pages
- Diagnosis and Reliable Design of Digital Systems by Melvin A. Breuer on 4 pages
- The Synthesis Approach to Digital System Design (The Springer International Series in Engineering and Computer Science) by Petra Michel on 4 pages
- Digital Logic Testing and Simulation by Alexander Miczo on 4 pages
See all 54 books this book cites
- Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing) by Erik Larsson in Back Matter
- Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) by M. Bushnell in Back Matter
- A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) by Charles E. Stroud in Back Matter
- Networks on Chip by Hannu Tenhunen on page 152
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