Join Amazon Prime and ship Two-Day for free and Overnight for $3.99. Already a member? Sign in.
|
Frequently Bought Together
Customers Who Bought This Item Also Bought
by Dieter K. Schroder
|
The Physics of Solar Cells (Properties of Semiconductor Materials) by Jenny Nelson |
Physics and Technology of Semiconductor Devices (A Wiley international edition) by A. S. Grove |
Fundamentals of Semiconductors: Physics and Materials Properties by Peter Y. Yu |
Handbook of Semiconductor Manufacturing Technology, Second Edition by Robert Doering |
Editorial Reviews
Product Description
Explains the theoretical and experimental foundations of the measurement of the electrical properties of the MOS system and the technology for controlling its properties. Emphasizes the silica and the silica-silicon interface. Provides a critical assessment of the literature, corrects incomplete or incorrect theoretical formulations, and gives critical comparisons of measurement methods. Contains information needed to grow an oxide, make an MOS capacitor array, and fabricate an integrated circuit with optimal performance and stability.
From the Publisher
Explains the theoretical and experimental foundations of the measurement of the electrical properties of the MOS system and the technology for controlling its properties. Emphasizes the silica and the silica-silicon interface. Provides a critical assessment of the literature, corrects incomplete or incorrect theoretical formulations, and gives critical comparisons of measurement methods. Contains information needed to grow an oxide, make an MOS capacitor array, and fabricate an integrated circuit with optimal performance and stability. --This text refers to the Hardcover edition.
See all Editorial Reviews
Explains the theoretical and experimental foundations of the measurement of the electrical properties of the MOS system and the technology for controlling its properties. Emphasizes the silica and the silica-silicon interface. Provides a critical assessment of the literature, corrects incomplete or incorrect theoretical formulations, and gives critical comparisons of measurement methods. Contains information needed to grow an oxide, make an MOS capacitor array, and fabricate an integrated circuit with optimal performance and stability.
From the Publisher
Explains the theoretical and experimental foundations of the measurement of the electrical properties of the MOS system and the technology for controlling its properties. Emphasizes the silica and the silica-silicon interface. Provides a critical assessment of the literature, corrects incomplete or incorrect theoretical formulations, and gives critical comparisons of measurement methods. Contains information needed to grow an oxide, make an MOS capacitor array, and fabricate an integrated circuit with optimal performance and stability. --This text refers to the Hardcover edition.
See all Editorial Reviews
Product Details
Would you like to update product info or give feedback on images?
|
Inside This Book
(learn more)
First Sentence:
Control of the electrical properties of the MOS system has been one of the major factors that has led to stable and high performance silicon integrated circuits. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
interface trap level density, interface trap levels, frequency capacitance method, interface trap properties, interface trap level densities, oxide fixed charge density, bulk trap levels, interface trap response, trap admittance, acceptor interface traps, minority carrier response time, gate bias corresponding, charge nonuniformities, elementary capacitors, oxide charge distribution, given band bending, flatband point, donor interface traps, equivalent parallel conductance, interface trap charge density, interface trap sites, time constant dispersion, type interface traps, charged interface traps, negative oxide charge Key Phrases - Capitalized Phrases (CAPs): (learn more)
Solid-State Electron, New York, Electron Devices, After Nicollian, Pergamon Press, Bell Syst, After Powell, After Snow, After Grove, After Goetzberger, Solid-State Commun, Surface Sci, After Ligenza, Electrochemical Society Meeting, General Radio, After Baccarani, After Deuling, After Kriegler, Cox Cox, Extended Abstracts of the May, After Declerck, After Gwyn, After Yon, Van Nostrand, After Brews New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Control of the electrical properties of the MOS system has been one of the major factors that has led to stable and high performance silicon integrated circuits. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
interface trap level density, interface trap levels, frequency capacitance method, interface trap properties, interface trap level densities, oxide fixed charge density, bulk trap levels, interface trap response, trap admittance, acceptor interface traps, minority carrier response time, gate bias corresponding, charge nonuniformities, elementary capacitors, oxide charge distribution, given band bending, flatband point, donor interface traps, equivalent parallel conductance, interface trap charge density, interface trap sites, time constant dispersion, type interface traps, charged interface traps, negative oxide charge Key Phrases - Capitalized Phrases (CAPs): (learn more)
Solid-State Electron, New York, Electron Devices, After Nicollian, Pergamon Press, Bell Syst, After Powell, After Snow, After Grove, After Goetzberger, Solid-State Commun, Surface Sci, After Ligenza, Electrochemical Society Meeting, General Radio, After Baccarani, After Deuling, After Kriegler, Cox Cox, Extended Abstracts of the May, After Declerck, After Gwyn, After Yon, Van Nostrand, After Brews New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 79
books:
See all 79 books this book cites
- Physics and Technology of Semiconductor Devices (A Wiley international edition) by A. S. Grove on 8 pages
- Semiconductor Devices by S.M. Sze on 5 pages
- Physics of Semiconductor Devices by Simon M. Sze on 5 pages
- Sio2 and Its Interfaces (Materials Research Society Symposium Proceedings) by Sokrates T. Pantelides on 4 pages
- Characterization of Solid Surfaces by Philip F. Kane on page 421, page 751, and page 828
See all 79 books this book cites
Books on Related Topics
(learn more)
|
What Do Customers Ultimately Buy After Viewing This Item?
 |
62% buy the item featured on this page: MOS (Metal Oxide Semiconductor) Physics and Technology (Wiley Classics Library) $123.19 |
 |
24% buy Semiconductor Material and Device Characterization $135.61 |
 |
14% buy Design of Analog CMOS Integrated Circuits $70.87 |
Suggested Tags from Similar Products(What's this?)Be the first one to add a relevant tag (keyword that's strongly related to this product).
|
Help others find this product — tag it for Amazon search
No one has tagged this product for Amazon search yet. Why not be the first to suggest a search for which it should appear?
Sell a Digital Version of This Book in the Kindle Store
If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store.
Learn more
Customer Reviews
|
Share your thoughts with other customers:
|
||||||||||||||||||||||
Most Helpful Customer Reviews
Share your thoughts with other customers: Create your own review
|
 |
Customer Discussions
Beta (What's this?)
New! See all customer communities, and bookmark your communities to keep track of them.
|
This product's forum
(0 discussions)
Ask questions, Share opinions, Gain insight
Active discussions in related forums
|
||||||||||||||||||||||||||||||||||||||||||
Product Information from the Amapedia Community
Beta (What's this?)Be the first person to add an article about this item at Amapedia.com.
› See featured Amapedia.com articles
Listmania!
|
|
So You'd Like to...
Look for Similar Items by Category
Bath Wonders from LUSH |
Best Books of 2008 |
|||||||||
|
Your Recent History
(What's this?)|
You have no recently viewed items or searches.
After viewing product detail pages or search results, look here to find an easy way to navigate back to pages you are interested in. Look to the right column to find helpful suggestions for your shopping session. |
Continue shopping: Top Sellers
| ||||
| ||
| ||
| ||
| ||
| ||
