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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
 
 
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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) (Hardcover)

by Wayne B. Nelson (Author) "This chapter presents mathematical models for accelerated life tests with constant stress..." (more)
Key Phrases: mean log life, good compromise plans, reallocated plan, Inch Electrodes, Induction Hardened, Monte Carlo (more...)
4.8 out of 5 stars See all reviews (4 customer reviews)


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Paperback (1) $116.50 $100.20 32 used & new from $90.39

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Editorial Reviews

Review
"…an essential resource for an statistician involved in product development and testing...available in an attractive and reasonably priced format." (Technometrics, August 2005)

"Researchers in insulation and engineers in general...will find this an outstanding reference book that will be used constantly." (IEEE Electrical Insulation Magazine, May/June 2005) --This text refers to the Paperback edition.

Product Description
In recent years, much useful methodology has been developed in accelerated testing--this book makes it available to practitioners. Many products last so long that life testing at design conditions is impractical. However, these products can be life-tested at high-stress conditions to yield failures quickly. Such testing saves much time and money--and analyses of data from an accelerated test yield needed information on product life at design (low stress) conditions. Presents practical, modern, statistical methods for accelerated testing including test models, analyses of data and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. Contains many real test examples along with data analyses, computer programs and references to the literature.

See all Editorial Reviews


Product Details

  • Hardcover: 616 pages
  • Publisher: Wiley-Interscience (February 1990)
  • Language: English
  • ISBN-10: 0471522775
  • ISBN-13: 978-0471522775
  • Product Dimensions: 9 x 6.6 x 1.1 inches
  • Shipping Weight: 2 pounds
  • Average Customer Review: 4.8 out of 5 stars See all reviews (4 customer reviews)
  • Amazon.com Sales Rank: #1,185,000 in Books (See Bestsellers in Books)

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Customer Reviews

4 Reviews
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Average Customer Review
4.8 out of 5 stars (4 customer reviews)
 
 
 
 
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Most Helpful Customer Reviews

 
25 of 25 people found the following review helpful:
5.0 out of 5 stars best book in accelerated testing, February 9, 2008
Nelson is a private consultant who has worked on countless practical problems in reliability from his consulting practice and previous employment at General Electric. He is an excellent lecturer and writer. His earlier book "Applied Life Data Analysis" was considered to be one of the best texts on reliability.
This book is very thorough in its treatment of all aspects of accelerated testing and is filled with many good references. Nelson carefully defines the mathematical models which consist of two components, (1) an acceleration function which describes how the mean lifetime changes as a function of the acceleration factor and (2) a probability distribution that explains the random variability of outcomes at each acceleration factor. A particular mean function could be the Arrhenius relationship and the probability distribution could be exponential. Hence there is not a single Arrhenius acceleration model but rather an Arrhenius-exponential, an Arrhenius-lognormal or an Arrhenius-Weibull model. The book is filled with interesting theory and examples. Nelson provides excellent practical guidance based on his wealth of experience.

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19 of 20 people found the following review helpful:
5.0 out of 5 stars best statistical account of accelerated testing, June 21, 2000
Nelson is a private consultant who has worked on countless practical problems in reliability from his consulting practice and previous employment at General Electric. He is an excellent lecturer and writer. His earlier book "Applied Life Data Analysis" was considered to be one of the best texts on reliability.

This book is very thorough in its treatment of all aspects of accelerated testing and is filled with many good references. Nelson carefully defines the mathematical models which consist of two components, (1) an acceleration function which describes how the mean lifetime changes as a function of the acceleration factor and (2) a probability distribution that explains the random variability of outcomes at each acceleration factor. A particular mean function could be the Arrhenius relationship and the probability distribution could be exponential. Hence there is not a single Arrhenius acceleration model but rather an Arrhenius-exponential, an Arrhenius-lognormal or an Arrhenius-Weibull model. The book is filled with interesting theory and examples. Nelson provides excellent practical guidance based on his wealth of experience.

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1 of 1 people found the following review helpful:
4.0 out of 5 stars Should be on every Developer and Engineer's shelf., October 31, 2006
By Steven Burns (Los Angeles) - See all my reviews
(REAL NAME)   
Dr. Taylor does his usual great job covering a difficult subject - ties in well with his "Applied Life Data Analysis", the revered reliability resource. Because of his GE background, he emphasizes experimental plans and analysis methods (i.e.: partially censored) which permit you to make good predictions regarding a product or system while you are still collecting data (e.g.: management wants an answer NOW, even if the experiment is not completed). A few more examples of how "typical" systems behave would be helpful, but otherwise a great resource.
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5.0 out of 5 stars Great companion volume to Applied Life Data Analysis
I agree with the previous reviewer that this is the definitive classic in accelerated life testing. It's a great companion volume to Dr. Read more
Published on January 30, 2004 by sameervittal

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