Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series) (Hardcover)

by Marc De Graef (Author)
Key Phrases: electron microdiffraction, electrostatic lattice potential, primary tilt axis, Pseudo Code, New York, Numerical Recipes (more...)

Editorial Reviews

Review
'... ideal for students as well as for researchers new to the field.' Materials World

'The inner workings of the TEM are described comprehensively, from both a theoretical and practical point of view ... engagingly written ... This book aims to be a practical introduction and guide to TEM and achieves this extremely well.' Materials World

'... a clear and extremely well-illustrated do-it-yourself book on conventional TEM of crystals and their defects.' Ultramicroscopy

'The introduction to each chapter is engagingly written, generally beginning with some historic or real-world examples before getting into the mathematics behind the machine. This serves to whet the reader's appetite for more information as the chapters lead into well written mathematical theory ... The book aims to be a practical introduction and guide to TEM and achieves this extremely well. Any student who reads this book from cover to cover and follows the examples given will be well on their way to performing useful TEM evaluation.' Materials World

Product Description
This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids.The work is based on a lecture course given by Marc De Graef in the Department of Materials Science and Engineering at Carnegie Mellon University.

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Product Details

• Hardcover: 740 pages
• Publisher: Cambridge University Press (April 21, 2003)
• Language: English
• ISBN-10: 0521620066
• ISBN-13: 978-0521620062
• Product Dimensions: 9.9 x 6.7 x 1.4 inches
• Shipping Weight: 3.4 pounds (View shipping rates and policies)
• Average Customer Review: 4.5 out of 5 stars See all reviews (2 customer reviews)
• Amazon.com Sales Rank: #3,305,322 in Books (See Bestsellers in Books)

Customer Reviews

Most Helpful Customer Reviews

1 of 1 people found the following review helpful:

4.0 out of 5 stars Wonderful Introduction to Transmission Electron Microscopy, February 15, 2007

By	Ulfilas (Washington, DC) - See all my reviews

This review is from: Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series) (Paperback)

For my taste, this book is the best introduction to Transmission Electron Microscopy that I have read. It is written at a higher level than Williams and Carter. This book is probably best suited to students with a B.S. in Physics. At the very least one should have benefited from a two semester undergraduate course on Modern Physics (including such things as solving the Schrodinger Equation for the Hydrogen atom) before tackling this book. I wish that a book like this had been out thirty years ago when I started learning TEM! This book does a very good job on two-beam theory and has truly wonderful dispersion surface diagrams.

5.0 out of 5 stars Excellent, August 20, 2003

By A Customer

This review is from: Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series) (Paperback)

I took Prof. de Graef's class at CMU in 2001, and we used pre-prints of this text. Even in that mostly-finished form, it was excellent. It's only improved now that I have the finished, published form.

Although I found the mathematical formalism that makes up the middle of this book excessive, it is important for people who will be modelling TEM experiments. The remainder of the book, on TEM basics, operation, and image/SADP interpretation, are all excellent.

This book is an excellent CTEM text.