Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) [BRAILLE] (Hardcover)

by Charles Evans (Author), Richard Brundle (Author), Wilson (Author) "Though a wide range of analytical techniques is covered in this volume there are certain traits common to many of them..." (more)
Key Phrases: optical scatterometry, grazing geometry, depth profiling mode, New York, Related Articles, Academic Press (more...)

Editorial Reviews

Review
This book is good but far too expensive. It puts a strain on the students. -- Review

Review
This book is good but far too expensive. It puts a strain on the students.

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Product Details

• Hardcover: 800 pages
• Publisher: Butterworth-Heinemann (August 18, 1992)
• Language: English
• ISBN-10: 0750691689
• ISBN-13: 978-0750691680
• Product Dimensions: 9.2 x 6.3 x 1.8 inches
• Shipping Weight: 2.4 pounds
• Average Customer Review: 4.0 out of 5 stars See all reviews (1 customer review)
• Amazon.com Sales Rank: #1,413,105 in Books (See Bestsellers in Books)

Customer Reviews

Most Helpful Customer Reviews

3 of 3 people found the following review helpful:

4.0 out of 5 stars Materials Characterization Overview, August 7, 2007

By	Zoltan Ring (Durham, NC USA) - See all my reviews (REAL NAME)

I purchased the book to help me better understand materials characterization for semiconductors. The book covers 50 materials characterization techniques, each of which is summarized in a single page at the beginning of the book. The book is then divided chapter by chapter for imaging techniques, electron beam instruments, diffractions, electron/x ray emission, visible, vibrational spectroscopies, ion scattering and mass spectroscopies, each written by an expert in the field.
Although the chapters follow a similar format, some of them lack important aspects of characterization: Some chapter may not give adequate examples of a typical spectra, or others may be short on instrumentation. Because of the limit of space given for each characterization method, the authors had to balance width with depth, and the scale sometimes tipped to width. Notwithstanding the shortcomings of the book, it has been extremely useful to understand the basics of each characterization method, thus I gave it a 4 star rating.
I am also reading a related book "Scanning Electron Microscopy and X ray Microanalysis" by Goldstein, a book on SEM related techniques, and finding that the book has excellent width and depth, and very clear in its presentation