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Speckle Metrology (Optical Engineering)
 
 
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Speckle Metrology (Optical Engineering) (Hardcover)

by Rajpal S. Sirohi (Editor) "When a laser-illuminated diffuse surface undergoes displacement and/or deformation, the speckles appearing in the scattered field or in its image show displacement accompanied by change..." (more)
Key Phrases: white light speckle method, speckle shear interferometry, speckle photography, New York, Lasers Eng, Laser Technol (more...)
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Editorial Reviews
Review
. . .an important addition to this field.
---Optics & Photonics News
. . .a good book. . ..covers most of the important aspects of speckle metrology.
---Optical Engineering

Product Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Product Details

Inside This Book (learn more)
First Sentence:
When a laser-illuminated diffuse surface undergoes displacement and/or deformation, the speckles appearing in the scattered field or in its image show displacement accompanied by change in structure. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
white light speckle method, speckle shear interferometry, speckle photography, speckle displacement, spatial filtering detector, speckle velocimeters, uniform reference system, photography fringe analysis, diffraction halo effect, speckle strain gauge, laser speckle method, pointwise filtering, speckle photographs, interrogation intensity, rotational slope contours, speckle wave, unexpanded laser beam, automatic fringe analysis, correlation fringes, speckle shifts, digital speckle pattern interferometry, interrogation region, surface roughness evaluation, speckle movements, laser speckle interferometry
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Lasers Eng, Laser Technol, Applications of Laser Anemometry, Surface Roughness Evaluation, Cambridge Univ, Photographs of the Young, Sirohi Figure, Krishna Mohan, Mendoza Santoyo, Optical Society of America, World Scientific, After Asakura, After Ref, Agfa Scientia, Monte Carlo, Particle Image Velocimetrv, Rastogi Figure, Strain Anal, Vikram Figure, Vovel Applications
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Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover | Surprise Me!
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