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Best Test Design (Rasch Measurement Series)

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Best Test Design (Rasch Measurement Series) (Paperback)

by Benjamin Drake Wright (Author), Mark H. Stone (Author)

3.5 out of 5 stars See all reviews (2 customer reviews)

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Product Details

Paperback: 240 pages
Publisher: M E S a Press; 1 edition (March 30, 1979)
Language: English
ISBN-10: 094193800X
ISBN-13: 978-0941938006

Average Customer Review: 3.5 out of 5 stars See all reviews (2 customer reviews)

Amazon.com Sales Rank: #1,584,949 in Books (See Bestsellers in Books)

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Citations (learn more)

18 books cite this book:

Advances in Measurement in Educational Research and Assessment by G.N. Masters on 6 pages
Research Methods in Psychology by Professor Glynis Breakwell on page 193, and Back Matter
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects) by Sivakumar Alagumalai on page 77, and page 177
Language Test Construction and Evaluation (Cambridge Language Teaching Library) by J. Charles Alderson on page 104, and Back Matter
Continuity and Innovation: Revising the Cambridge Proficiency in English examination 1913-2002 (Studies in Language Testing) by University of Cambridge Local Examinations Syndicate in Back Matter

See all 18 books citing this book

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3.5 out of 5 stars (2 customer reviews)

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14 of 14 people found the following review helpful:

5.0 out of 5 stars A good book to start with!, April 13, 1999

By	Thomas R O'Neill (Lexington, KY 40509) - See all my reviews

This book explains how the Rasch model imposes a measurement system upon data. It explains how counting is misleading and how the Rasch model permits sample-free item calibration and test-free person measures. The concept of fit is explained as well. While the formulae are included in this book, one does not have to be a mathematician to understand the ideas. This book will serve the novice and the veteran well.

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2.0 out of 5 stars This book is dated, June 16, 2009

By	Svend Kreiner - See all my reviews (REAL NAME)

This book was perhaps important 30 years ago. So much has happened in Rasch modeling and IRT since then that it only is of interest to those who want to study the history of the Rasch models.

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