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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing)
 
 

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing) (Hardcover)

~ Krishnendu Chakrabarty (Editor) "Until recently, most electronic systems consisted of one or multiple printed circuit boards, containing multiple integrated circuits (ICs) each..." (more)
Key Phrases: consecutive testability, test scheduling problem, test pattern list, Test Symposium, Atlantic City, Kluwer Academic Publishers (more...)
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14 new from $70.96 3 used from $147.18

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Product Description

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

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Inside This Book (learn more)
First Sentence:
Until recently, most electronic systems consisted of one or multiple printed circuit boards, containing multiple integrated circuits (ICs) each. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
consecutive testability, test scheduling problem, test pattern list, test protocol expansion, reconfigurable wrappers, skew violations, test access infrastructure, delay generator circuit, access mechanism design, test application time, minimum hardware overhead, test access architecture, core test language, embedded core test, diagnostic test algorithm, partitioned testing with run, test access mechanism, early design space exploration, test access paths, test vector pair, longest scan chain, core test wrapper, crosstalk defects, test data compression, test input pins
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Symposium, Atlantic City, Kluwer Academic Publishers, Syndrome Compressor, Computer Society, Krishnendu Chakrabarty Abstract, Mentor Graphics, Revised January, International Workshop, Design of System-on-a-Chip Test Access, Eindhoven University of Technology, Size Time, Indian Institute of Technology, International Conference, Los Angeles, Philips Research, San Jose, Simulated Annealing, Received September, University of Texas, Design Automation Conference, Marina del Rey, Serial Bypass, University of Iowa, Update Register
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