CTL for Test Information of Digital ICS (Hardcover)

~ (Author) "ICs have been designed, manufactured, tested and used in a larger system for many years..." (more)
Key Phrases: sigref expr, internal scan cell, test pattern units, Focus Corelnstance, Purpose Production, Boundary Primitive (more...)

Editorial Reviews

Review

From the reviews: "The book is a welcome addition to the literature. It is definitely useful as a reference for anyone who is interested in creating test programs for SoC designs. This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." (Microelectronics Reliability, 43 (2003) "CTL for test information of Digital ICs will have significant impact and will be accessible to anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies. The author has done an excellent job. It is a pleasure to read and consult a book that tries to promote understanding, not just coverage. Indeed a stimulating book … ." (Current Engineering Practice, Vol. 47, 2002-2003)

Product Description

An example-oriented book on CTL that is written to explain the use of examples describing syntax and semantics of the language.

Product Details

• Hardcover: 186 pages
• Publisher: Springer; 1 edition (October 31, 2002)
• Language: English
• ISBN-10: 1402072937
• ISBN-13: 978-1402072932
• Product Dimensions: 9.5 x 6.1 x 0.7 inches
• Shipping Weight: 15.2 ounces (View shipping rates and policies)
• Average Customer Review: No customer reviews yet. Be the first.
• Amazon.com Sales Rank: #3,828,517 in Books (See Bestsellers in Books)