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Product Description
In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That's why the fifth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book.
About the Author
Roger H. Harlow, Jr. is an Instructor at Mesa Community College, Mesa, AZ. --This text refers to the Paperback edition.
In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That's why the fifth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book.
About the Author
Roger H. Harlow, Jr. is an Instructor at Mesa Community College, Mesa, AZ. --This text refers to the Paperback edition.
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Inside This Book
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First Sentence:
We can trace measurement to the early Phoenicians when they were trading around the Mediterranean Sea. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
wringing interval, sine instruments, gaging force, episcopic projection, pneumatic comparators, optical polygons, vernier instruments, gaging pressure, metrological features, gage blocks, generalized measurement system, gaging element, jig transit, precision reference specimens, scan prism, caliper principle, tooling bar, roughness comparison specimens, alignment collimator, optical square, manipulative error, beam trammel, plain micrometer, vernier height gage, balanced dials Key Phrases - Capitalized Phrases (CAPs): (learn more)
United States, Sharpe Mfg, Courtesy of Brown, Courtesy of Federal Products Corp, World War, Courtesy of Engis Equipment, American Standards Association, Contact Angle, Setup Measurements, Comparison Metric, Courtesy of Taylor Hobson, Fed Accuracy Grade, Hobson Ltd, Mendenhall Act, Scale Figure, Sir Joseph Whitworth, Surface Measurements, Table Rotated, Total Quality Management, Courtesy of Micro-Radian Instruments, Courtesy of Renishaw, Courtesy of Scherr-Tumico, Courtesy of Taft, Discrimination Divides Tolerance, International Prototype Meter New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
We can trace measurement to the early Phoenicians when they were trading around the Mediterranean Sea. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
wringing interval, sine instruments, gaging force, episcopic projection, pneumatic comparators, optical polygons, vernier instruments, gaging pressure, metrological features, gage blocks, generalized measurement system, gaging element, jig transit, precision reference specimens, scan prism, caliper principle, tooling bar, roughness comparison specimens, alignment collimator, optical square, manipulative error, beam trammel, plain micrometer, vernier height gage, balanced dials Key Phrases - Capitalized Phrases (CAPs): (learn more)
United States, Sharpe Mfg, Courtesy of Brown, Courtesy of Federal Products Corp, World War, Courtesy of Engis Equipment, American Standards Association, Contact Angle, Setup Measurements, Comparison Metric, Courtesy of Taylor Hobson, Fed Accuracy Grade, Hobson Ltd, Mendenhall Act, Scale Figure, Sir Joseph Whitworth, Surface Measurements, Table Rotated, Total Quality Management, Courtesy of Micro-Radian Instruments, Courtesy of Renishaw, Courtesy of Scherr-Tumico, Courtesy of Taft, Discrimination Divides Tolerance, International Prototype Meter New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 12
books:
See all 12 books this book cites
4
books
cite this book:
- Juran's Quality Control Handbook by J.M. Juran on page 23, and Back Matter
- Probability and Statistics in Engineering by William W. Hines in Back Matter
- Elementary Statistics (with Students Suite & Video Skillbuider CD-ROMs) (10th Edition) by Robert R. Johnson in Back Matter
- Statistical Quality Control (McGraw-Hill Series in Industrial Engineering and Management) by Eugene Grant in Back Matter
- Probability and Statistics: WITH Minitab Student Version Release 14 by William W. Hines in Back Matter
See all 12 books this book cites
- Fundamentals of Manufacturing 2nd Edition by Philip D. Rufe on page 341, and Back Matter
- Industrial Metrology by Graham T. Smith on page 67
- Quality Engineering Handbook, Second Edition, Revised and Expanded (Quality and Reliability) by Thomas Pyzdek in Back Matter
- Synchrotron Radiation Sources: A Primer (Series on synchrotron radiation techniques & applications) by Herman Winick on page 304
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72% buy the item featured on this page: Fundamentals of Dimensional Metrology $99.04 |
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