Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)

~ (Author) "For many years, radio frequency (RF) devices have been tested only to ensure that they perform to specifications..." (more)
Key Phrases: synthesizer settling time, contactor socket, multisite testing, Agilent Technologies, Frequency Figure, Ohm's Law (more...)

Editorial Reviews

Product Description

With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.

About the Author

Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas.

Joe Kelly is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Dr. Kelly earned his Ph.D. and M.S. in Ceramic and Materials Engineering at Rutgers University. He is a frequent presenter at international conferences and workshops.

Product Details

• Hardcover: 272 pages
• Publisher: Artech House Publishers (March 31, 2004)
• Language: English
• ISBN-10: 1580536921
• ISBN-13: 978-1580536929
• Product Dimensions: 10.2 x 7 x 0.8 inches
• Shipping Weight: 1.4 pounds (View shipping rates and policies)
• Average Customer Review: 3.8 out of 5 stars  See all reviews (5 customer reviews)
• Amazon.com Sales Rank: #954,089 in Books (See Bestsellers in Books)

Customer Reviews

Most Helpful Customer Reviews

1.0 out of 5 stars Calibration section is useless, November 30, 2008

By	Microwave Engineer (New Hampshire, USA) - See all my reviews

Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)

The author blows right by the topic of RF measurement system calibration and the analysis of measurement uncertainty. RF measurement system calibration techniques, is an essential topic if the Test Engineer is to be successful. Without this knowledge, the Test Engineer will become frustrated and deplete his/her resources when the time comes to correlate the test system measurements.
In addition; while performing a cursory review, I came across a misconception relating to S-Parameters. On pages 16 and 17, the author references a non-linear device (mixer) to explain the concept of S-Parameters. S-Parameters, by definition, are linear parameters; however, the author states the mixer's conversion loss, a non-linear parameter, is also S21. He is correct with respect to a 3-port device having nine (9) S-Parameters, however, S21 of the mixer is the IF isolation (rejection) with respect to the RF port and IF port respectfully. This statement is a complete misconception. S-Parameters is a fundamental concept, providing a solid base to RF and microwave engineering. It is apparent; the author does not understand the subject matter. To the neophyte, he looks like an authority. To the wiser, he is a snake-oil salesman and should not be allowed to publish fiction as a reference book. If you cannot run with the big dogs, then sit on the porch.

3.0 out of 5 stars Production Testing of RF and System-on-a-Chip Devices for Wireless Communications, February 8, 2008

By	T. pham - See all my reviews (REAL NAME)

The title of the book is very attractive to a test engineer who wants to learn RF testing. The book includes and explains most of the RF terms albeit superficially. From reading the title I wish the author, who is an experience RF app/test engineer, could start with a simple pseudo or real RF device. Then the author could create the real test codes on either Agilent (the author is from Agilent) or a pseudo tester along with the explanation. So to make the book exact of its meaning: production.

5.0 out of 5 stars Great Book to have - for Current RF test - to be RF test Engineers., April 29, 2007

By	Pustak Pasal (Dallas, Texas) - See all my reviews

This book provide precise definition and concept about RF tests. The process included in this book covers allmost all techniques that are currently in use.
i have recently joined UWB -wireless R&D company as Test engineer. This book amazingly covers almost all the RF tests terms and concept that i have come through so far.
very good book to have