Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology) (Hardcover)

by G. Kaupp (Author) "Atomic force microscopy (AFM) is also known as scanning force microscopy (SFM)..." (more)
Key Phrases: anisotropic molecular migrations, apertured tip, normal displ, New York, International Conference, Thin Solid Films (more...)

Editorial Reviews

Product Description

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Product Details

• Hardcover: 292 pages
• Publisher: Springer; 1 edition (September 15, 2006)
• Language: English
• ISBN-10: 3540284052
• ISBN-13: 978-3540284055
• Product Dimensions: 9.3 x 6.2 x 0.6 inches
• Shipping Weight: 1.2 pounds (View shipping rates and policies)
• Average Customer Review: 2.0 out of 5 stars See all reviews (1 customer review)
• Amazon.com Sales Rank: #1,975,112 in Books (See Bestsellers in Books)

Customer Reviews

Most Helpful Customer Reviews

2.0 out of 5 stars Not very rigorous, December 22, 2008

By	J. R. Torres (RI United States) - See all my reviews (REAL NAME)

This book is not very rigorous. It does not cover the details on the techniques. Very few diagrams. A lot of data with little scaling, theoretical treatment or simple mathematics to describe results. What am I supposed to do?... Memorize the results for each experiment?... It is representative with the poor state of research science. Lots of money, lots of people spending it buying equipment, and everybody doing what everybody else is doing, except using a different material. Poor... poor... poor...