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Product Description
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
About the Author
Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas.
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
About the Author
Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas.
Joe Kelly is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Dr. Kelly earned his Ph.D. and M.S. in Ceramic and Materials Engineering at Rutgers University. He is a frequent presenter at international conferences and workshops.
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Inside This Book
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First Sentence:
For many years, radio frequency (RF) devices have been tested only to ensure that they perform to specifications. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
synthesizer settling time, contactor socket, multisite testing, measuring phase noise, pseudonoise signal, adjacent channel power ratio, digital pin, concurrent testing, error vector magnitude, gain flatness, multiband radios, load board, probe card, wafer prober, amplitude imbalance, parallel testing, arbitrary waveform generators, synchronization word, wafer probing, test floor, input power level, noise floor, production testing, automated test equipment, phase imbalance Key Phrases - Capitalized Phrases (CAPs): (learn more)
Agilent Technologies, Frequency Figure, Ohm's Law, Moore's Law, International Test Conference, Prentice Hall, Upper Saddle River, Hewlett Packard, Microwave Journal, Oxford University Press, Physical Review, Rudy Garcia New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
For many years, radio frequency (RF) devices have been tested only to ensure that they perform to specifications. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
synthesizer settling time, contactor socket, multisite testing, measuring phase noise, pseudonoise signal, adjacent channel power ratio, digital pin, concurrent testing, error vector magnitude, gain flatness, multiband radios, load board, probe card, wafer prober, amplitude imbalance, parallel testing, arbitrary waveform generators, synchronization word, wafer probing, test floor, input power level, noise floor, production testing, automated test equipment, phase imbalance Key Phrases - Capitalized Phrases (CAPs): (learn more)
Agilent Technologies, Frequency Figure, Ohm's Law, Moore's Law, International Test Conference, Prentice Hall, Upper Saddle River, Hewlett Packard, Microwave Journal, Oxford University Press, Physical Review, Rudy Garcia New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 23
books:
See all 23 books this book cites
- Spectrum and Network Measurements by Robert A. Witte on page 93, and page 222
- Microwave Engineering by David M. Pozar on page 92, and page 222
- Microwave Circuit Modeling Using Electromagnetic Field Simulation (Artech House Microwave Library) by Daniel G. Swanson Jr. in Back Matter
- Computer-Aided Analysis of Nonlinear Microwave Circuits (Artech House Microwave Library) by Paulo J. C. Rodrigues in Back Matter
- Microwaves and Wireless Simplified (Artech House Antennas and Propagation Library) by Thomas S. Laverghetta in Back Matter
See all 23 books this book cites
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What Do Customers Ultimately Buy After Viewing This Item?
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53% buy the item featured on this page: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) $106.20 |
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34% buy An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering) $119.20 |
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13% buy Practical Radio Frequency Test and Measurement: A Technician's Handbook $47.88 |
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