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A model for correlated failures in N-version programming.: An article from: IIE Transactions [HTML] [Digital]

Y.S. Dai (Author), M. Xie (Author), K.L. Poh (Author), S.H. Ng (Author)

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Product Details

Format: HTML
Printable: Yes
Mac OS Compatible: Yes
Windows Compatible: Yes
Handheld Compatible: Yes
File Size: 51 KB
Digital: 29 pages
Publisher: Institute of Industrial Engineers, Inc. (IIE) (August 1, 2005)
Required Free Software: Any web browser

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