- Series: Spie Field Guides
- Spiral-bound: 154 pages
- Publisher: SPIE Press; Spi edition (January 20, 2014)
- Language: English
- ISBN-10: 0819497991
- ISBN-13: 978-0819497994
- Package Dimensions: 8 x 6 x 1 inches
- Shipping Weight: 6.4 ounces (View shipping rates and policies)
- Average Customer Review: Be the first to review this item
- Amazon Best Sellers Rank: #2,951,190 in Books (See Top 100 in Books)
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Field Guide to Displacement Measuring Interferometry (FG30) (Spie Field Guides) Spi Edition
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About the Author
Jonathan D. Ellis is currently an Assistant Professor at the University of Rochester with a joint appointment in the Department of Mechanical Engineering and the Institute of Optics. He obtained his doctorate from the DelftUniversity of Technology in the Netherlands, and M.S. and B.S. degrees from the University of North Carolina at Charlotte, all in mechanical engineering. He actively participates in SPIE, the Optical Society of America (OSA), and the American Society for Precision Engineering (ASPE). He currently serves as Director-at-Large and Treasurer for ASPE.
Professor Ellis research interests are in precision engineering, interferometry, optical metrology, instrumentation for primary standards level metrology, freeform optics fabrication and metrology, and precision scanning systems.
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