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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods 1st Edition

4.7 out of 5 stars 3 customer reviews
ISBN-13: 978-0470822982
ISBN-10: 0470822988
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Editorial Reviews

From the Back Cover

This work is a clearly written and highly illustrated introduction to modern characterization techniques, enabling users to understand the composition and structure of materials. Encompassing not just material structure but also chemical analysis, Materials Characterization covers all key structural and functional materials from metals and semiconductors to polymers and ceramics.
  • Details state-of-the-art techniques commonly used in modern materials characterization, including metallography, X-ray diffraction, electron and scanning probe microscopies, X-ray energy dispersive spectroscopy, vibrational spectroscopy, popular surface analysis techniques, and thermal analysis
  • Explains in simple terms how the instruments work, providing a practical guide to experimental set-up
  • Contains numerous graphics to illustrate concepts and techniques
  • Extensive end-of-chapter questions help with readers' understanding
  • Based on ten years’ experience of a successful course

Materials Characterization is an introductory book ideal for scientists and engineers embarking on material-related research and development. It is also an essential tool for advanced undergraduate and postgraduate students taking a first course on the topic.

About the Author

Yang Leng is a Professor of Materials Science at Hong Kong University of Science and Technology. His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has authored nearly 80 papers in international journals and has been granted two US patents. In addition, he commissioned more than a dozen industrial reports. His contribution to teaching materials science is exemplified by the Teaching Excellence Appreciation award from the HKUST.
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Product Details

  • Hardcover: 384 pages
  • Publisher: Wiley; 1 edition (June 2, 2008)
  • Language: English
  • ISBN-10: 0470822988
  • ISBN-13: 978-0470822982
  • Product Dimensions: 7 x 1 x 10 inches
  • Shipping Weight: 1.5 pounds
  • Average Customer Review: 4.7 out of 5 stars  See all reviews (3 customer reviews)
  • Amazon Best Sellers Rank: #1,080,549 in Books (See Top 100 in Books)

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Top Customer Reviews

By Yolanda A. Daza on March 18, 2013
Format: Hardcover Verified Purchase
It is a good book for beginners but not deep enough for learning techniques or appropriate way of data analysis.
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Format: Hardcover Verified Purchase
Great book for XRD, Raman, TGA/DSC, SEM, TEM. The only reason I did not give it 5 stars was because I would have liked it if it also included DMA which it does not.
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Format: Hardcover Verified Purchase
Very good
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