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Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications 1st Edition

ISBN-13: 978-0415568821
ISBN-10: 041556882X
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Editorial Reviews

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"This is a useful monograph on applications of observed wave and particle interference patterns to reconstruct structural details of scattering materials. It can equally serve as a comprehensive textbook to graduate students and as a reference book to professionals in the field."
Zentralblatt MATH 1323

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