- Hardcover: 350 pages
- Publisher: Springer; 2010 edition (August 18, 2010)
- Language: English
- ISBN-10: 1441963472
- ISBN-13: 978-1441963475
- Product Dimensions: 6.1 x 0.8 x 9.2 inches
- Shipping Weight: 1.3 pounds
- Average Customer Review: 8 customer reviews
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#3,216,431 in Books (See Top 100 in Books)
- #571 in Books > Science & Math > Experiments, Instruments & Measurement > Time
- #810 in Books > Engineering & Transportation > Engineering > Electrical & Electronics > Electronics > Microelectronics
- #824 in Books > Engineering & Transportation > Engineering > Industrial, Manufacturing & Operational Systems > Quality Control
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Reliability Physics and Engineering: Time-To-Failure Modeling 2010th Edition
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From the Back Cover
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: • Materials/Device Degradation • Degradation Kinetics • Time-To-Failure Modeling • Statistical Tools • Failure-Rate Modeling • Accelerated Testing • Ramp-To-Failure Testing • Important Failure Mechanisms for Integrated Circuits • Important Failure Mechanisms for Mechanical Components • Conversion of Dynamical Stresses into Static Equivalents • Small Design Changes Producing Major Reliability Improvements This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter. Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists.
About the Author
Dr. J.W. McPherson is a Texas Instruments Senior Fellow Emeritus and an IEEE Fellow. He has published approximately 200 papers on Reliability Physics and Engineering, written Reliability Chapters in four books, holds 12 patents and was a past General Chair of the International Reliability Physics Symposium. McPherson's broad reliability experience, with both electrical and mechanical failure mechanisms, makes him ideally suited to author a general textbook on Reliability Physics and Engineering.
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Top customer reviews
Throughout the book, the author tries to give examples for reliability issues for pipes, tires, turbine blades, but without question, the primary thrust of the book is semiconductor reliability. The chapters deal with device degradation and fitting degradation data; statistics (Normal, Lognormal and Weibull distribution); failure rate; accelerated degradation and modeling, ramp to failure test, and TTF models for semiconductor circuits (this being the condensed version of Dr. McPherson's work), mechanical reliability issues and conversion of dynamic stress into static equivalent.
There are plenty of examples (with realistic experimental data) in each chapter to illustrate how to fit data, how to construct the statistics and calculate statistical variables; how to accelerate degradation and to project to use conditions for exponential and power law models; analytical formulas for ramp testing establishing effective time at fail stress level for exponential and power law models. TTF models for semiconductor circuits chapter include electron and stress migration and their relation to grain boundaries and conductor geometries; corrosion and exponential corrosion model with RH%; thermal cycling and associated crack propagation - plastic deformation and corresponding Cofin-Manson model; Time-Dependent Dielectric Breakdown (TDDB) - E, 1/E and 1/SQRT(E) models are discussed and compared for lifetime projections; Mobile Surface Inversion, Hot Carrier Injection and Negative Bias Instability are also discussed. Mechanical reliability issues - most with semiconductor reliability issues in mind - are discussed in a separate chapter: bonds and Mie-Gruneisen potential, ionic bonds, elastic and inelastic behavior of metals, grain boundaries, fracture strength, creep and fatigue.
The book has a laser focus and clarity and does not degenerate into abstract academic discussions other than what is necessary for understanding issues at hand. The reader can follow up with the references and McPherson's publications - which have the same clarity and notation system that the book does. I highly recommend the book especially for those with a generic engineering background who deal with reliability - for them the book is going to be an eye opener.
I wish I owned it.
I bought this book because of the topics it covered which attract me to learn more deep in physic of failure in electronic and its models. The illustration in the book are good.
What I really disappointed for the Kindle version is the table of content is not clickable. It is hard to jump to specific topic in interest. Second, some equations are found disappeared, e.g. 11.2, 11.3, 11.4 and so on. Not sure how many equations are lost in other chapter.
All I expect is a fixed version for best reading experience.
I am using the Android Kindle version 184.108.40.206