- Hardcover: 689 pages
- Publisher: Springer; 3rd edition (April 30, 2007)
- Language: English
- ISBN-10: 0306472929
- ISBN-13: 978-0306472923
- Product Dimensions: 7.5 x 2 x 10.5 inches
- Shipping Weight: 2.9 pounds (View shipping rates and policies)
- Average Customer Review: 19 customer reviews
Amazon Best Sellers Rank:
#192,889 in Books (See Top 100 in Books)
- #3 in Books > Science & Math > Experiments, Instruments & Measurement > Electron Microscopes & Microscopy
- #6 in Books > Engineering & Transportation > Engineering > Materials & Material Science > Testing
- #10 in Books > Science & Math > Experiments, Instruments & Measurement > Microscopes & Microsocopy
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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition 3rd Edition
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“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005)
“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. 9 (5), October, 2003)
About the Author
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
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It is also very well illustrated. For a book about an imaging technology, this is obviously quite important. There are many instances where there are sets of images to compare the results achieved with varied operating parameters.
The text is well organized. It begins with an assumption that you know some basic physics and chemistry, but doesn't require any background in microscopy. Both the Table of Contents and Index are detailed enough to enable specific searches for specific subject matter.
This is a textbook I look forward to reading in the evening, and one that I look forward to finishing. It matches very well with the practical work I'm doing on the SEM.
I just started working in a SEM lab and wanted to know more of the technical science behind it. My co-worker, who has been doing SEM for ~5 years recommend the book to me.
This book has greatly exceeded my expectations and has impressed me with the technical content.
Worth the $$$.
Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information.