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EMP Environment and System Hardness Design

by Dr. Rabindra N. Ghose (Author)
See all formats and editions
Nuclear EMP is surveyed with its impact on electronic systems and vulnerability and system hardness verification. Sources of EMP and the resulting environment are reviewed including the mechanism of the EMP field, deposition region and resulting EM levels for high-altitude, ground and near-ground and underground bursts. Internal EMP and system-generated EMP are discussed. Covered in detail are the entry modes of EMP energy into systems.

Coupling models include cables and transmission lines acting as antennas in varying configurations and through shields and enclosures, apertures, slots and slits, and through utility systems. EMP susceptibilities in electronic systems include circuit vulnerability, latchup, permanent damage and burnout. Prediction & analysis via math models of transfer functions of sources, media, coupling & victims are presented. The system is also analyzed via vulnerability prediction and the methodology is discussed in detail including zoning & coupling analysis.

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  1. ISBN-10
    093226316X
  2. ISBN-13
    978-0932263162
  3. Publisher
    Don White Consultants
  4. Publication date
    January 1, 1984
  5. Language
    English
  6. Dimensions
    6.5 x 0.75 x 9.5 inches
  7. Print length
    250 pages
  8. See all details
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